ORNL-1816 - the Molten Salt Energy Technologies Web Site
ORNL-1816 - the Molten Salt Energy Technologies Web Site
ORNL-1816 - the Molten Salt Energy Technologies Web Site
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ANP QUARTERLY PROGRESS REPORT<br />
appearance of <strong>the</strong> as-received and tested Tic and<br />
Cr,C,. These corrosion data are not selective<br />
enough to designate whe<strong>the</strong>r Tic or Cr,C, is <strong>the</strong><br />
superior material. If <strong>the</strong> lower strength and/or<br />
more brittle nature of <strong>the</strong> Cr,C, are obiectionable,<br />
0.01<br />
0.02<br />
0.03<br />
' 1<br />
?<br />
0.04<br />
Fig. 6.4. A-Nickel T-Joint Brazed with 60%<br />
Pd-37% Ni-3% Si and Exposed to NaF-ZrF4-UF4<br />
(53.540-6.5 mole %) at 15OO0F for 100 hr. Note<br />
voids at <strong>the</strong> interface between <strong>the</strong> braze material<br />
and <strong>the</strong> base metal. Unetched. 1OOX. Reduced<br />
38%.<br />
Fig. 6.5. A-Nickel T-Joint Brazed with 60%<br />
Pd-37% Ni-3% Si and A led for 100 hr at<br />
uated Capsule. Note voids at<br />
he braze material and <strong>the</strong> base<br />
metal. Unetched. 1OOX. Reduced 40%.<br />
84<br />
<strong>the</strong> Tic is superior. The ZrC showed signs of<br />
failing only in <strong>the</strong> fluoride mixture; <strong>the</strong> fine in-<br />
cipient cracks in <strong>the</strong> svrfaces of <strong>the</strong> ZrC particles<br />
may be seen in Fig. 6.11. There were indications<br />
that <strong>the</strong> fluoride mixture had penetrated <strong>the</strong> pore<br />
spaces throughout <strong>the</strong> ZrC; <strong>the</strong> pore spaces were<br />
not enlarged.<br />
Fig. 6.6. A-Nickel T-Joint Brazed with 82%<br />
Au-18% Ni and Exposed to Sodium Hydroxide for<br />
100 hr at 1500OF. Note slight attack at surface<br />
of braze. Etched with potassium cyanide. 200X.<br />
Reduced 39%.<br />
Fig. 6.7. A-Nickel T-Joint Brazed with 60%<br />
Pd-37% Ni-3% Si and Exposed to Sodium Hy-<br />
droxide for 100 hr at 1100OF. Note absence of<br />
voids at interface. 1OOX. Reduced 39%.<br />
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