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ORNL-2106 - the Molten Salt Energy Technologies Web Site

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i<br />

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ANP PROJECT PROGRESS REPORT<br />

two samples were taken from <strong>the</strong> same spool of<br />

Teflon-insulated wire. One sample was <strong>the</strong> usual<br />

length, 25 ft long, and <strong>the</strong> second was 50 ft long.<br />

The two samples were installed at <strong>the</strong> same time<br />

in hole 50-N of <strong>the</strong> <strong>ORNL</strong> Graphite Reactor. The<br />

25-ft Teflon-insulated sample was instal led in <strong>the</strong><br />

same manner as in <strong>the</strong> previous experiments, with<br />

no seal at <strong>the</strong> end. The 504 sample was doubled<br />

back on itself so that both ends of <strong>the</strong> wire were<br />

outside <strong>the</strong> reactor. The leakage between <strong>the</strong><br />

shield and <strong>the</strong> central conductor was measured to<br />

be twice as large for <strong>the</strong> 50-ft sample as for <strong>the</strong><br />

25-ft sample. The photo-emf measurements on <strong>the</strong><br />

two wires were identical. It can <strong>the</strong>refore be<br />

concluded that <strong>the</strong> radiation effects described<br />

previously2* were due to bulk properties ra<strong>the</strong>r<br />

than to end surface conduction or to air ionization.<br />

5<br />

4<br />

x3 m<br />

> -<br />

+4<br />

c z<br />

W<br />

LL m<br />

2 2<br />

t<br />

0<br />

I<br />

Barriers<br />

A 1N38A germanium point-contact rectifier was<br />

exposed in a 2 x 106-r/hr Co60 gamma-ray source,<br />

and <strong>the</strong> forward and reverse currents were measured<br />

at 1-v bias. The behavior of <strong>the</strong> current is shown<br />

in Fig. 4.2.14. These data are in qualitative<br />

agreement with those obtained by Young.30 The<br />

increase in reverse current, followed by a return<br />

toward its initial value, is an effect not found in<br />

reactor irradiation experiments because it occurs<br />

at low total damage. As may be seen from <strong>the</strong><br />

change in forward current, <strong>the</strong> effect illustrated in<br />

Fig. 4.2.14 would have occurred before <strong>the</strong> sample<br />

30R. C. Young, Gamma Radiation of Crystal Diodes,<br />

Wright Air Development Center, WCRT-TN-54-255 (Dee.<br />

28, 1954).<br />

~<br />

I<br />

IN38A-B<br />

0 REVERSE CURRENT, pa<br />

0 FORWARD CURRENT, ma x lo-'<br />

IN38A-A<br />

A REVERSE BIAS. NORMALIZED TO<br />

- COMPARE WITd lN38A-B -<br />

UNCLASSIFIED<br />

<strong>ORNL</strong>-LR-DWG 13755<br />

0 t 2 3 4 5 6 7 ( x IO7,<br />

GAMMA EXPOSURE lrl<br />

Fig. 4.2.14. Effect of Gamma Radiation on Conduction Through a Barrier. Germanium point-contact<br />

rectifier 1N38A-B exposed to 2 x lo6 r/hr from Co6O source; 1N38A-A exposed to 2.5 x 105r/hrfrom<br />

C060 source.<br />

244<br />

e<br />

1

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