ORNL-2106 - the Molten Salt Energy Technologies Web Site
ORNL-2106 - the Molten Salt Energy Technologies Web Site
ORNL-2106 - the Molten Salt Energy Technologies Web Site
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i<br />
I<br />
ANP PROJECT PROGRESS REPORT<br />
two samples were taken from <strong>the</strong> same spool of<br />
Teflon-insulated wire. One sample was <strong>the</strong> usual<br />
length, 25 ft long, and <strong>the</strong> second was 50 ft long.<br />
The two samples were installed at <strong>the</strong> same time<br />
in hole 50-N of <strong>the</strong> <strong>ORNL</strong> Graphite Reactor. The<br />
25-ft Teflon-insulated sample was instal led in <strong>the</strong><br />
same manner as in <strong>the</strong> previous experiments, with<br />
no seal at <strong>the</strong> end. The 504 sample was doubled<br />
back on itself so that both ends of <strong>the</strong> wire were<br />
outside <strong>the</strong> reactor. The leakage between <strong>the</strong><br />
shield and <strong>the</strong> central conductor was measured to<br />
be twice as large for <strong>the</strong> 50-ft sample as for <strong>the</strong><br />
25-ft sample. The photo-emf measurements on <strong>the</strong><br />
two wires were identical. It can <strong>the</strong>refore be<br />
concluded that <strong>the</strong> radiation effects described<br />
previously2* were due to bulk properties ra<strong>the</strong>r<br />
than to end surface conduction or to air ionization.<br />
5<br />
4<br />
x3 m<br />
> -<br />
+4<br />
c z<br />
W<br />
LL m<br />
2 2<br />
t<br />
0<br />
I<br />
Barriers<br />
A 1N38A germanium point-contact rectifier was<br />
exposed in a 2 x 106-r/hr Co60 gamma-ray source,<br />
and <strong>the</strong> forward and reverse currents were measured<br />
at 1-v bias. The behavior of <strong>the</strong> current is shown<br />
in Fig. 4.2.14. These data are in qualitative<br />
agreement with those obtained by Young.30 The<br />
increase in reverse current, followed by a return<br />
toward its initial value, is an effect not found in<br />
reactor irradiation experiments because it occurs<br />
at low total damage. As may be seen from <strong>the</strong><br />
change in forward current, <strong>the</strong> effect illustrated in<br />
Fig. 4.2.14 would have occurred before <strong>the</strong> sample<br />
30R. C. Young, Gamma Radiation of Crystal Diodes,<br />
Wright Air Development Center, WCRT-TN-54-255 (Dee.<br />
28, 1954).<br />
~<br />
I<br />
IN38A-B<br />
0 REVERSE CURRENT, pa<br />
0 FORWARD CURRENT, ma x lo-'<br />
IN38A-A<br />
A REVERSE BIAS. NORMALIZED TO<br />
- COMPARE WITd lN38A-B -<br />
UNCLASSIFIED<br />
<strong>ORNL</strong>-LR-DWG 13755<br />
0 t 2 3 4 5 6 7 ( x IO7,<br />
GAMMA EXPOSURE lrl<br />
Fig. 4.2.14. Effect of Gamma Radiation on Conduction Through a Barrier. Germanium point-contact<br />
rectifier 1N38A-B exposed to 2 x lo6 r/hr from Co6O source; 1N38A-A exposed to 2.5 x 105r/hrfrom<br />
C060 source.<br />
244<br />
e<br />
1