Applications of Spin-Polarized Electrons in Condensed ... - CASA
Applications of Spin-Polarized Electrons in Condensed ... - CASA
Applications of Spin-Polarized Electrons in Condensed ... - CASA
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<strong>Applications</strong> <strong>of</strong> <strong>Sp<strong>in</strong></strong>-<strong>Polarized</strong> <strong>Electrons</strong> <strong>in</strong><br />
<strong>Condensed</strong> Matter Physics<br />
Dan Pierce<br />
Electron Physics Group, NIST<br />
http://physics.nist.gov/epg<br />
Supported <strong>in</strong> part by the Office <strong>of</strong> Naval Research
Pr<strong>in</strong>ciple <strong>of</strong> GaAs <strong>Polarized</strong> e - Source<br />
Optical excitation <strong>of</strong> sp<strong>in</strong> polarized electrons<br />
For positive helicity σ + light, the theoretical polarization <strong>of</strong> the<br />
electrons photoexcited by bandgap radiation is<br />
N −N<br />
N + N<br />
P= ↑ ↓<br />
↑ ↓<br />
=<br />
1-3<br />
1+3<br />
= -50%<br />
Polarization is easily and rapidly reversed by switch<strong>in</strong>g helicity <strong>of</strong> light<br />
Pierce and Meier, PR B 13,5484-5500 (1976)
Negative Electron Aff<strong>in</strong>ity (NEA) GaAs<br />
Surface treatment gives world’s best photoemitter<br />
Source characteristics:<br />
P ~ 30% for bulk wafer<br />
I = 20 µA/mW<br />
cont<strong>in</strong>uous or pulsed operation<br />
low <strong>in</strong>itial energy and energy spread<br />
high figure <strong>of</strong> merit = P 2 I
Charlie’s Hippie Days
<strong>Sp<strong>in</strong></strong> <strong>Polarized</strong> Electron Gun<br />
<strong>Sp<strong>in</strong></strong> polarized e - scatter<strong>in</strong>g apparatus<br />
Measure<br />
I −I<br />
A= I + I<br />
↑↑ ↑↓<br />
↑↑ ↑↓<br />
∝M<br />
Pierce, Celotta, Wang, Unertl, Galejs, Kuyatt, Mielczarek, RSI 51, 478-499 (1980)
<strong>Polarized</strong> e - Gun for SLAC Parity Violation Experiment<br />
Beam polarization, 35% to 45% Beam current, 1 mA cw to 15 A peak
Complete <strong>Polarized</strong> e - Injection System<br />
for SLAC Parity Violation Experiment
Technical Support <strong>in</strong> the Early Days
Development <strong>of</strong> Measurement Techniques<br />
Us<strong>in</strong>g <strong>Sp<strong>in</strong></strong>-<strong>Polarized</strong> <strong>Electrons</strong><br />
<strong>Sp<strong>in</strong></strong>-polarized electron gun (NEA GaAs)<br />
<strong>Sp<strong>in</strong></strong> polarized electron scatter<strong>in</strong>g<br />
<strong>Sp<strong>in</strong></strong> polarized low energy electron diffraction (SPLEED)<br />
<strong>Sp<strong>in</strong></strong> polarized <strong>in</strong>verse photoemission spectroscopy (SPIPES)<br />
<strong>Sp<strong>in</strong></strong> polarized electron energy loss spectroscopy (SPEELS)<br />
<strong>Sp<strong>in</strong></strong> polarized low energy electron microscopy (SPLEEM)<br />
Electron sp<strong>in</strong> polarization analyzer<br />
<strong>Sp<strong>in</strong></strong> polarized photoemission<br />
<strong>Sp<strong>in</strong></strong> polarized Auger electron spectroscopy<br />
<strong>Sp<strong>in</strong></strong> polarized secondary electron emission<br />
Scann<strong>in</strong>g Electron Microscopy with Polarization Analysis (SEMPA)
Surface Sensitivity<br />
Surface sensitive due to short electron mean free paths<br />
Inelastic mean free path especially short <strong>in</strong> transition metals with many d holes<br />
<strong>Sp<strong>in</strong></strong> dependent attenuation length <strong>in</strong> ferromagnets at low energy<br />
Pappas et al, PRL 66, 504 (1991)
<strong>Sp<strong>in</strong></strong> <strong>Polarized</strong> Electron Gun<br />
<strong>Sp<strong>in</strong></strong> polarized e - scatter<strong>in</strong>g apparatus<br />
Measure<br />
I −I<br />
A= I + I<br />
↑↑ ↑↓<br />
↑↑ ↑↓<br />
∝M<br />
Pierce, Celotta, Wang, Unertl, Galejs, Kuyatt, Mielczarek, RSI 51, 478-499 (1980)
<strong>Sp<strong>in</strong></strong> <strong>Polarized</strong> Low Energy Electron<br />
Diffraction (SPLEED)<br />
First surface magnetization measurement with SPLEED<br />
IAA , IAB<br />
A=A(E,θ,H,T)<br />
θ<br />
A(H)<br />
Test for true magnetic effect by measur<strong>in</strong>g field and temperature dependence<br />
A(T)<br />
Celotta, Pierce, Wang, Bader, Felcher, PRL 43, 728 (1979)
<strong>Sp<strong>in</strong></strong>-<strong>Polarized</strong> Electron Scatter<strong>in</strong>g<br />
Measure low temperature surface magnetization<br />
Ni 40 Fe 40 B 20<br />
Thermal excitation <strong>of</strong> sp<strong>in</strong> waves<br />
M( T)<br />
=- 1 BT32<br />
/ + .... Theory:<br />
M(<br />
0)<br />
B<br />
B surface<br />
bulk<br />
B s /B b =3<br />
Results expla<strong>in</strong>ed by extend<strong>in</strong>g theory to <strong>in</strong>clude<br />
weaker exchange coupl<strong>in</strong>g <strong>of</strong> surface to bulk, J S⊥ 2
<strong>Sp<strong>in</strong></strong>-<strong>Polarized</strong> Electron Scatter<strong>in</strong>g<br />
Determ<strong>in</strong>e surface critical exponent<br />
A lot <strong>of</strong> theory but few experiments for<br />
magnetic critical behavior at surfaces<br />
A ex ∝ t β , where t=[1-(T/T C )]. F<strong>in</strong>d β≅0.78 for both<br />
Ni(110) and Ni(100) surfaces, <strong>in</strong>dependent <strong>of</strong> E and θ<br />
Neutron measurements give β=0.38 for bulk<br />
Alvarado, Campagna, Hopster, PRL 48, 51 (1982)
<strong>Sp<strong>in</strong></strong> <strong>Polarized</strong> Inverse Photoemission Spectroscopy<br />
A= P<br />
<strong>Sp<strong>in</strong></strong> dependent bandstructure <strong>of</strong> unfilled states<br />
Energy, angle (k), and sp<strong>in</strong>-resolved <strong>in</strong>verse photoemission<br />
Photon detector sensitivity<br />
Measure<br />
hw = 97 . ± 035 . eV<br />
F<br />
G<br />
HG<br />
1<br />
0 cosa<br />
I<br />
J<br />
KJ<br />
A B<br />
A B<br />
n -n<br />
n + n<br />
Large m<strong>in</strong>ority sp<strong>in</strong> peak just above<br />
Fermi level from the d-holes<br />
responsible for ferromagnetism <strong>in</strong> Ni<br />
Unguris, Seiler, Celotta, Pierce, Johnson, Smith, PRL 49, 1047 (1982)
Runn<strong>in</strong>g with Friends<br />
Bay to Breakers
Stopp<strong>in</strong>g to read while others catch up
Tough
Happy on top<br />
<strong>of</strong> the mounta<strong>in</strong>
A S<strong>in</strong>clair Grand Canyon<br />
Expedition
You’re not try<strong>in</strong>’ if<br />
your not bleed<strong>in</strong>’!<br />
Determ<strong>in</strong>ed
Pr<strong>in</strong>cipled<br />
Two th<strong>in</strong>gs I can’t<br />
tolerate:<br />
Incompetence and<br />
Cold C<strong>of</strong>fee
Married <strong>in</strong> 1983!
How ‘bout them legs
<strong>Sp<strong>in</strong></strong> <strong>Polarized</strong> Secondary Emission<br />
High sp<strong>in</strong> polarization where have high secondary <strong>in</strong>tensity<br />
Fe 81.5 B 14.5 Si 4<br />
Valence electron polarization<br />
n −n<br />
n<br />
P=<br />
↑ ↓<br />
n + n<br />
=<br />
n<br />
=<br />
↑ ↓<br />
B<br />
V<br />
M =-m ( n -n<br />
)<br />
B<br />
# Bohr magnetons<br />
# Valence electrons<br />
A B<br />
n B n V P<br />
Fe 2.2 8 0.28<br />
Co 1.7 9 0.19<br />
Ni 0.055 10 0.055<br />
Unguris, Pierce, Galejs, Celotta, PRL 49, 72 (1982)
Scann<strong>in</strong>g Electron Microscopy<br />
with Polarization Analysis (SEMPA)<br />
High resolution magnetization imag<strong>in</strong>g<br />
Incident <strong>Electrons</strong> From<br />
Scann<strong>in</strong>g Electron Microscope<br />
Magnetic<br />
Specimen<br />
<strong>Sp<strong>in</strong></strong>-Polarization Analyzer<br />
<strong>Sp<strong>in</strong></strong>-<strong>Polarized</strong><br />
Secondary <strong>Electrons</strong><br />
Magnetization<br />
M= -µ B (N ↑ -N ↓)<br />
P = N ↑ -N ↓<br />
N ↑ + N ↓
NIST SEMPA Apparatus<br />
Auger<br />
Electron<br />
Energy<br />
Analyzer<br />
Ion Gun<br />
Secondary &<br />
Backscatter<br />
Electron<br />
Detectors<br />
Electron<br />
Source<br />
Sample<br />
RHEED Screen<br />
In-Plane<br />
Metal<br />
Evaporators<br />
Polarization<br />
Analyzers<br />
Out-<strong>of</strong>-Plane<br />
Acquisition time (m<strong>in</strong>)<br />
1000<br />
100<br />
10<br />
1<br />
0.1<br />
Old LaB 6<br />
New Field Emission<br />
10 keV<br />
20 keV<br />
0.01<br />
1 10 100 1000<br />
Beam diameter (nm)
4 cm<br />
Low Energy Diffuse Scatter<strong>in</strong>g Analyzer<br />
Input Optics<br />
Anode<br />
MCP<br />
G2<br />
G1<br />
E2<br />
Drift Tube<br />
E1<br />
Au & C Targets<br />
150 eV e -<br />
Y<br />
A<br />
D B<br />
C<br />
End View<br />
Au evaporator<br />
X
SEMPA Example – Iron Crystal<br />
Measure the topography and two magnetization components<br />
(simultaneously but separately):<br />
Intensity<br />
Then derive the<br />
magnetization<br />
direction and<br />
magnitude:<br />
M x<br />
Direction<br />
θ = tan -1 (M x/M y)<br />
M y<br />
Magnitude<br />
⏐M⏐ = (M x 2 + My 2 ) 1/2
Out-<strong>of</strong>-plane M<br />
M contour<br />
In-plane M<br />
Cobalt Vector Magnetization
SEMPA – MFM Comparison<br />
Hard disk test sample with Au patterned overlay<br />
SEMPA<br />
Intensity M AFM MFM<br />
350 nm
Interlayer Exchange Coupl<strong>in</strong>g<br />
Cr wedge schematic<br />
Cr Wedge<br />
∼ 500 µm<br />
Fe Whisker<br />
M<br />
Fe Film<br />
∼ 1-2 nm<br />
0 - 20 nm<br />
Unguris, Celotta, Pierce, PRL 67, 140 (1991)
Fe/Cr/Fe Oscillatory Exchange Coupl<strong>in</strong>g<br />
M<br />
P(Fe)<br />
P(Cr)<br />
0.2<br />
0.0<br />
-0.2<br />
0.04<br />
0.0<br />
-0.04<br />
Precise measurement <strong>of</strong> coupl<strong>in</strong>g periods<br />
RHEED<br />
0 10 20 30 40 50 60 70 80<br />
Cr Thickness (layers)<br />
Interlayer Measured period<br />
(layers)<br />
Cr<br />
0.144 nm/layer<br />
Ag<br />
0.204 nm/layer<br />
Au<br />
0.204 nm/layer<br />
2.105 ±0.005<br />
12 ±1<br />
2.37 ±0.07<br />
5.73 ±0.05<br />
2.48 ±0.05<br />
8.6 ±0.3
Leadership
Vision<br />
We’ll get there if<br />
you can keep up<br />
with me
Between a rock and a hard place
Magnetic Depth Pr<strong>of</strong>il<strong>in</strong>g Co/Cu Multilayers<br />
Magnetoresistance and doma<strong>in</strong> structure<br />
Current through magnetic multilayer depends on magnetization alignment,<br />
but real doma<strong>in</strong> structures can be complex:<br />
Cu<br />
Co<br />
Ion milled crater<br />
(2 keV Ar + )<br />
i<br />
M<br />
Top Co layer<br />
2 nd Co layer<br />
Top layer magnetization predom<strong>in</strong>antly<br />
antiparallel to 2 nd layer<br />
Borchers, Dura, Unguris, Tulch<strong>in</strong>sky, Kelley, Majkrzak, Hsu, Loloee, Pratt, Bass, PRL 82, 2796 (1999)
Interlayer Doma<strong>in</strong> Correlations<br />
Quantify layer-by-layer angle distributions<br />
Angle images:<br />
1st layer 2nd layer<br />
P(∆φ)<br />
Correlation distribution:<br />
FM AFM<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0.0<br />
0 90 180<br />
∆φ (°)
Magnetic materials<br />
Air Side Wheel Side<br />
Transformer core ferromagnetic glass<br />
(Allied Signal)
Cr<br />
Magnetic Nanostructures<br />
Fe “nanowires”<br />
Fe<br />
Fe evaporated at graz<strong>in</strong>g <strong>in</strong>cidence on Cr l<strong>in</strong>es<br />
fabricated by laser focused atom deposition<br />
M<br />
213 nm<br />
Tulch<strong>in</strong>sky, Kelley, McClelland, Gupta, Celotta, JVST A16, (1998)
Ready to retire???
Acknowledgements<br />
<strong>Sp<strong>in</strong></strong>-polarized electron work at NBS/NIST<br />
Many contributors,<br />
especially Bob Celotta and John Unguris<br />
Pictures <strong>of</strong> Charlie<br />
Joel Falk<br />
Jim Murray<br />
Roger Route