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XPS on Shap feldspars<br />

• 15°, 45°and 90°= 2.5, 6 and 9 nm<br />

• Si enriched, K and Na depleted<br />

~1-2 nm<br />

• Surface chemistry modified<br />

without destroying feldspar<br />

framework (leaching of alkalis)<br />

• Layer is present (1-2 nm) but<br />

difficult to resolve on TEM.<br />

XPS data represents “dilution<br />

of result” with depth

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