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XPS on Shap feldspars<br />
• 15°, 45°and 90°= 2.5, 6 and 9 nm<br />
• Si enriched, K and Na depleted<br />
~1-2 nm<br />
• Surface chemistry modified<br />
without destroying feldspar<br />
framework (leaching of alkalis)<br />
• Layer is present (1-2 nm) but<br />
difficult to resolve on TEM.<br />
XPS data represents “dilution<br />
of result” with depth