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An Introduction to Neutron Scattering - Spallation Neutron Source

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Direct Inversion of Reflectivity Data is Possible*<br />

• Use different “fronting” or “backing” materials for two<br />

measurement of the same unknown film<br />

– E.g. D 2 O and H 2 O “backings” for an unknown film deposited on a quartz<br />

substrate or Si & Al 2 O 3 as substrates for the same unknown sample<br />

– Allows Re(R) <strong>to</strong> be obtained from two simultaneous equations for<br />

R<br />

1<br />

2<br />

and<br />

R<br />

2<br />

2<br />

– Re(R) can be Fourier inverted <strong>to</strong> yield a unique SLD profile<br />

• <strong>An</strong>other possibility is <strong>to</strong> use a magnetic “backing” and<br />

polarized neutrons<br />

SiO 2<br />

Unknown film<br />

H2O or D2O<br />

Si or Al 2 O 3 substrate<br />

* Majkrzak et al Biophys Journal, 79,3330 (2000)

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