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"Chapter 1 - The Op Amp's Place in the World" - HTL Wien 10

"Chapter 1 - The Op Amp's Place in the World" - HTL Wien 10

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<strong>10</strong>.3.4 Burst Noise<br />

Some characteristics of flicker noise:<br />

It <strong>in</strong>creases as <strong>the</strong> frequency decreases, hence <strong>the</strong> name 1/f<br />

It is associated with a dc current <strong>in</strong> electronic devices<br />

It has <strong>the</strong> same power content <strong>in</strong> each octave (or decade)<br />

E n K v<br />

ln fmax In Ki ln<br />

fm<strong>in</strong> fmax fm<strong>in</strong> <strong>Op</strong> Amp Noise <strong>The</strong>ory and Applications<br />

Types of Noise<br />

(<strong>10</strong>–14)<br />

Where:<br />

K e and K i are proportionality constants (volts or amps) represent<strong>in</strong>g E n and I n<br />

at 1 Hz<br />

f max and f m<strong>in</strong> are <strong>the</strong> m<strong>in</strong>imum and maximum frequencies <strong>in</strong> Hz<br />

Flicker noise is found <strong>in</strong> carbon composition resistors, where it is often referred to as excess<br />

noise because it appears <strong>in</strong> addition to <strong>the</strong> <strong>the</strong>rmal noise that is <strong>the</strong>re. O<strong>the</strong>r types<br />

of resistors also exhibit flicker noise to vary<strong>in</strong>g degrees, with wire wound show<strong>in</strong>g <strong>the</strong><br />

least. S<strong>in</strong>ce flicker noise is proportional to <strong>the</strong> dc current <strong>in</strong> <strong>the</strong> device, if <strong>the</strong> current is kept<br />

low enough, <strong>the</strong>rmal noise will predom<strong>in</strong>ate and <strong>the</strong> type of resistor used will not change<br />

<strong>the</strong> noise <strong>in</strong> <strong>the</strong> circuit.<br />

Reduc<strong>in</strong>g power consumption <strong>in</strong> an op amp circuit by scal<strong>in</strong>g up resistors may reduce <strong>the</strong><br />

1/f noise, at <strong>the</strong> expense of <strong>in</strong>creased <strong>the</strong>rmal noise.<br />

Burst noise, also called popcorn noise, is related to imperfections <strong>in</strong> semiconductor material<br />

and heavy ion implants. It is characterized by discrete high-frequency pulses. <strong>The</strong><br />

pulse rates may vary, but <strong>the</strong> amplitudes rema<strong>in</strong> constant at several times <strong>the</strong> <strong>the</strong>rmal<br />

noise amplitude. Burst noise makes a popp<strong>in</strong>g sound at rates below <strong>10</strong>0 Hz when played<br />

through a speaker — it sounds like popcorn popp<strong>in</strong>g, hence <strong>the</strong> name. Low burst noise<br />

is achieved by us<strong>in</strong>g clean device process<strong>in</strong>g, and <strong>the</strong>refore is beyond <strong>the</strong> control of <strong>the</strong><br />

designer. Modern process<strong>in</strong>g techniques at Texas Instruments has all but elim<strong>in</strong>ated its<br />

occurrence.<br />

<strong>10</strong>.3.5 Avalanche Noise<br />

Avalanche noise is created when a pn junction is operated <strong>in</strong> <strong>the</strong> reverse breakdown<br />

mode. Under <strong>the</strong> <strong>in</strong>fluence of a strong reverse electric field with<strong>in</strong> <strong>the</strong> junction’s depletion<br />

region, electrons have enough k<strong>in</strong>etic energy that, when <strong>the</strong>y collide with <strong>the</strong> atoms of <strong>the</strong><br />

crystal lattice, additional electron-hole pairs are formed (Figure <strong>10</strong>–4). <strong>The</strong>se collisions<br />

are purely random and produce random current pulses similar to shot noise, but much<br />

more <strong>in</strong>tense.<br />

<strong>10</strong>-9

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