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JAEA-Review-2010-065.pdf:15.99MB - 日本原子力研究開発機構

JAEA-Review-2010-065.pdf:15.99MB - 日本原子力研究開発機構

JAEA-Review-2010-065.pdf:15.99MB - 日本原子力研究開発機構

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4-15<br />

<strong>JAEA</strong>-<strong>Review</strong> <strong>2010</strong>-065<br />

Annealing Behavior of Vacancy-type Defects<br />

in Electron-irradiated SixGe1-x Bulk Crystals<br />

at Low Temperature<br />

Y. Nagai a) , K. Inoue a, b) , H. Takamizawa a) , T. Takeuchi a, c) , A. Kuramoto a) , T. Toyama a) ,<br />

M. Hasegawa d) and I. Yonenaga d)<br />

a) The Oarai Center, IMR, Tohoku Univ., b) Kyoto Univ., c) <strong>JAEA</strong>, d) IMR, Tohoku Univ.<br />

Vacancy-type defects in an electron-irradiated Si-Ge alloy (Si 0.85Ge 0.15) were investigated by positron annihilation<br />

technique. The Czochralski-growth undoped Si-Ge single crystals 1) were irradiated at 77 K with 2 MeV electrons to a<br />

fluence of 2.5 × 10 17 e/cm 2 . The specimens were set to a sample chamber for positron experiments without temperature rise,<br />

and then positron lifetime and coincidence Doppler broadening (CDB) measurements were performed at 80 K. The positron<br />

trapping at monovacancies was observed for as-irradiated state. The isochronal annealing up to 250 K resulted in the<br />

increase of high momentum component fraction of CDB, which indicates that the fraction of positron annihilation with Ge<br />

electrons for the specimen annealed at 250 K was higher than that for the unirradiated specimen. On the other hand,<br />

positron lifetime showed slight decrease by the annealing. These results strongly suggest that the vacancies are stabilized<br />

by being surrounded with Ge atoms.<br />

SixGe 1-x(0

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