JAEA-Review-2010-065.pdf:15.99MB - 日本原子力研究開発機構
JAEA-Review-2010-065.pdf:15.99MB - 日本原子力研究開発機構
JAEA-Review-2010-065.pdf:15.99MB - 日本原子力研究開発機構
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4-15<br />
<strong>JAEA</strong>-<strong>Review</strong> <strong>2010</strong>-065<br />
Annealing Behavior of Vacancy-type Defects<br />
in Electron-irradiated SixGe1-x Bulk Crystals<br />
at Low Temperature<br />
Y. Nagai a) , K. Inoue a, b) , H. Takamizawa a) , T. Takeuchi a, c) , A. Kuramoto a) , T. Toyama a) ,<br />
M. Hasegawa d) and I. Yonenaga d)<br />
a) The Oarai Center, IMR, Tohoku Univ., b) Kyoto Univ., c) <strong>JAEA</strong>, d) IMR, Tohoku Univ.<br />
Vacancy-type defects in an electron-irradiated Si-Ge alloy (Si 0.85Ge 0.15) were investigated by positron annihilation<br />
technique. The Czochralski-growth undoped Si-Ge single crystals 1) were irradiated at 77 K with 2 MeV electrons to a<br />
fluence of 2.5 × 10 17 e/cm 2 . The specimens were set to a sample chamber for positron experiments without temperature rise,<br />
and then positron lifetime and coincidence Doppler broadening (CDB) measurements were performed at 80 K. The positron<br />
trapping at monovacancies was observed for as-irradiated state. The isochronal annealing up to 250 K resulted in the<br />
increase of high momentum component fraction of CDB, which indicates that the fraction of positron annihilation with Ge<br />
electrons for the specimen annealed at 250 K was higher than that for the unirradiated specimen. On the other hand,<br />
positron lifetime showed slight decrease by the annealing. These results strongly suggest that the vacancies are stabilized<br />
by being surrounded with Ge atoms.<br />
SixGe 1-x(0