A coherent soft X-Ray source in Rome SPARX-FEL - CERN ...
A coherent soft X-Ray source in Rome SPARX-FEL - CERN ...
A coherent soft X-Ray source in Rome SPARX-FEL - CERN ...
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A <strong>coherent</strong> <strong>soft</strong><br />
X-<strong>Ray</strong> <strong>source</strong> <strong>in</strong> <strong>Rome</strong><br />
<strong>SPARX</strong>-<strong>FEL</strong><br />
Luigi Palumbo<br />
Università di Roma La Sapienza & INFN-LNF
The Galilei Microscope ( ~ 1600)<br />
CAS - November 8, 2008
<strong>Rome</strong> - Academy of L<strong>in</strong>cei (1603)<br />
QuickTime e un<br />
decompressore TIFF (Non compresso)<br />
sono necessari per visualizzare quest'immag<strong>in</strong>e.<br />
CAS - November 8, 2008<br />
FFederico d i CCesi i<br />
1585-1630<br />
Francesco<br />
Stelluti<br />
1577-<br />
1653
QuickTime e un<br />
decompressore TIFF (Non compresso)<br />
sono necessari per visualizzare quest'immag<strong>in</strong>e<br />
quest immag<strong>in</strong>e.<br />
CAS - November 8, 2008
CAS - November 8, 2008
Undulator spontaneous radiation Power:<br />
P<br />
T<br />
e<br />
2<br />
4 2<br />
= Ne<br />
γ v&<br />
3 ⊥<br />
6πεoc<br />
Coherent Stimulated Radiation Power:<br />
P<br />
T<br />
N<br />
e<br />
2 2<br />
e 4 2<br />
= γ v&<br />
3 ⊥<br />
6 6πε oc<br />
WE NEED micro-BUNCHING !<br />
CAS - November 8, 2008
CAS - November 8, 2008
CAS - November 8, 2008
Go<strong>in</strong>g to the VUV/X<br />
Wavelength limitations due to the need of high-reflect<strong>in</strong>g<br />
optics (mirrors)<br />
Develop<strong>in</strong>g<br />
a laser<br />
scheme<br />
that does<br />
not require<br />
optical<br />
elements.<br />
noormal<br />
<strong>in</strong>cidencce<br />
reflectance e<br />
1.0<br />
0.8<br />
0.6<br />
0.4<br />
0.2<br />
0.0<br />
SiC<br />
Os, Ir,<br />
Pt, Au<br />
Clean Al <strong>in</strong> UHV<br />
Dielectric multi-layers<br />
MgF on Al<br />
photon energy (eV)<br />
10 100 1000 10 000<br />
2<br />
multi-layers<br />
cristals<br />
measured<br />
multi-layers<br />
100 10<br />
wavelength (nm)<br />
1 0.1<br />
D.T. Attwood et al,<br />
AIP Conf. Proc. 118, eds J.M.J. Madey and C. Pellegr<strong>in</strong>i<br />
CAS - November 8, 2008<br />
(AIP, New York, 1983), p. 93
electron bunch tra<strong>in</strong><br />
<strong>FEL</strong> SASE <strong>FEL</strong><br />
undulator + optical resonator<br />
bunch<strong>in</strong>g<br />
electron bunch tra<strong>in</strong><br />
undulator (spontaneous ( p emission) )<br />
λ<br />
Classical <strong>FEL</strong> Scheme<br />
<strong>coherent</strong><br />
emission<br />
SASE <strong>FEL</strong> Scheme<br />
(Self Amplified Spontaneous Emission)<br />
CAS - November 8, 2008 bunch<strong>in</strong>g<br />
undulator (amplifier) ( p )<br />
λ<br />
<strong>coherent</strong><br />
emission
L<br />
P = αP n e z / L g<br />
Self Self-Amplified<br />
Self Amplified-Spontaneous<br />
Amplified Spontaneous-Emission<br />
Spontaneous Emission<br />
CAS - November 8, 2008
SASE-<strong>FEL</strong>’s S SE <strong>FEL</strong> s wwill ll pro provide de new hhigh gh<br />
power <strong>coherent</strong> <strong>source</strong>s<br />
• Ultra short wavelength : 0.1 - 10 nm<br />
• Ultrashort pulses
Fs-dynamics Chemical Reactions CHEMISTRY<br />
Magnetic Nanostructure Nanostr ct re MATERIAL SCIENCE<br />
Energy Dissipation <strong>in</strong> Clusters PHYSICS<br />
Brightness Complex Solids PHYSICS<br />
Catalysis, Electrochemistry TECHNOLOGY<br />
Spectro-microscopy LIFE/Environment<br />
Coherence Time resolved imag<strong>in</strong>g MATERIAL SCIENCE<br />
Biological systems LIFE SCIENCE<br />
Nanofabrication TECHNOLOGY<br />
Peak Power Clusters MATERIAL SCIENCE<br />
Athmospheric chemistry ENVIRONMENT<br />
Fusion Plasma TECHNOLOGY
X-<strong>FEL</strong> <strong>FEL</strong> facilities<br />
1 km<br />
CAS - November 8, 2008<br />
USA<br />
LCLS - SLAC 2009<br />
EEurope<br />
X-<strong>FEL</strong> – DESY 2012<br />
Japan<br />
SCSS – SPr<strong>in</strong>g8 2010
LCLS<br />
UCLA<br />
Short Wavelength SASE <strong>FEL</strong><br />
VISA-HGHG 4GLS TTF_II-FLASH<br />
X<strong>FEL</strong><br />
LEUTL<br />
BESSY<br />
LANL<br />
PAL<br />
Arc<br />
en Ciel<br />
FERMI SCSS<br />
LEG <strong>SPARX</strong><br />
SDUV<br />
CAS - November 8, 2008
CAS - November 8, 2008
A typical day, somewhere …<br />
CAS - November 8, 2008
Pace Maker<br />
Li-Batteries<br />
New Materials for Energy<br />
GPS Navigation<br />
Functional Materials<br />
Air Bag<br />
Accelaration Sensors<br />
MEMS<br />
Cosmetics<br />
TiO 2 Nanoparticle<br />
Mobile Phone<br />
SAW Structures<br />
Artificial Hips<br />
Biocompatible<br />
Materials<br />
Glasses and Coat<strong>in</strong>gs<br />
Optical Materials<br />
UV Filter<br />
Digital Camera<br />
CCD Chip<br />
Bike Frame<br />
Carbon Fibres<br />
Composite Materials<br />
Intelligent Credit Card<br />
Integrated Circ Circuits its<br />
Artificial Lens<br />
Bi Biocompatible tibl<br />
Polymers<br />
Exact Time via satellite<br />
Semiconductíng devices<br />
Micro-Batteries<br />
GMR Read Head LED Display<br />
CAS -Photonic November Materials 8, 2008 Taylored Materials at Work …with<strong>in</strong> Nature.<br />
Magnetic<br />
Multilayers
QuickTime e un<br />
decompressore TIFF (Non compresso)<br />
sono necessari per visualizzare quest'immag<strong>in</strong>e.<br />
NANO-TECHNOLOGY<br />
DYNAMICS OF<br />
MAGNETIC NANO-<br />
STRUCTURES (fs) ( )<br />
The dynamics y of non<br />
equlibrium states that follows<br />
a short magnetic field or<br />
Laser pulse determ<strong>in</strong>es<br />
the ultimate time-scale for<br />
read<strong>in</strong>g <strong>in</strong>formation<br />
IIn magnetic ti media<br />
di
NANO-TECHNOLOGY<br />
Nano-fabrication Nano fabrication with X-ray X ray lithography
BIOLOGY<br />
Membrane prote<strong>in</strong>s<br />
CAS - November 8, 2008
QuickTime e un<br />
decompressore TIFF (LZW)<br />
ecessari per visualizzare quest'immag<strong>in</strong>e.<br />
CAS - November 8, 2008<br />
BIOLOGY<br />
Oversampled X-ray diffraction<br />
pattern of coli bacteria.<br />
Recontruction from diffraction<br />
pattern,dense region are<br />
distribution of prote<strong>in</strong>s, p ,<br />
semitrasparent regions free<br />
of prote<strong>in</strong>s.<br />
Bacteria seen with trasmitted<br />
li light h and d fl fluorescence,
CAS - November 8, 2008
FEMTO-CHEMISTRY - Molecules dynamics<br />
xfel.desy.de<br />
CAS - November 8, 2008
<strong>FEL</strong> Applications - Polymer Surface Process<strong>in</strong>g<br />
<strong>FEL</strong> Applications - Micromach<strong>in</strong><strong>in</strong>g<br />
One good example is polyester fabric, which today still lacks<br />
the texture, feel, and appearance of fabric made from natural<br />
fibers. Development of an <strong>in</strong>dustrial-scale <strong>FEL</strong> for high-volume<br />
surface treatment will result <strong>in</strong> substantial improvement<br />
improvement.<br />
This electron micrograph of a polyester fabric surface<br />
microroughened with exposure to ultraviolet light from a<br />
conventional laser illustrates the effects of surface textur<strong>in</strong>g.<br />
Such a laser process<strong>in</strong>g treatment can give a polymer or fiber<br />
product new friction, filtration, wett<strong>in</strong>g, or appearance characteristics<br />
A free-electron laser can be used for to fabricate<br />
three-dimensional mechanical structures with<br />
dimensions as small as a micron one ten-thousandth<br />
of f a centimeter ti t and d with ith ffeatures t that th t are smaller ll still. till<br />
Examples of this micromach<strong>in</strong><strong>in</strong>g with <strong>FEL</strong>s are<br />
ultrahigh-density CD ROM technology and improved<br />
micro-optical devices.<br />
CAS - November 8, 2008
ENVIRONMENT<br />
Chemistry of radicals, photophysical reactions on<br />
the surface of suspended nanoparticles, effects on<br />
the ozone layer.
Project <strong>in</strong> <strong>Rome</strong><br />
CAS - November 8, 2008
(2003) SPARC TEST FACILITY<br />
(2005) <strong>SPARX</strong> R&D<br />
(2007) <strong>SPARX</strong>-<strong>FEL</strong> Facility
<strong>SPARX</strong> Goals<br />
<strong>SPARX</strong> workshops - ENEA CR Frascati 16.01.2001<br />
- INFN-LNF 09.05.2005<br />
- INFN-LNF INFN LNF 19 19.06.2007 06 2007<br />
SIMPOSI <strong>SPARX</strong> – March, June and October 2008<br />
Wavelength range :<br />
1.5 - 13.5 nm<br />
• water w<strong>in</strong>dow<br />
(~ 2.5 – 4.5 nm)<br />
• carbon w<strong>in</strong>dow<br />
(~ ( 45 45– 4.5 5.0 50nm) 5.0 nm)
SASE RADIATION<br />
12.4 1.24 0.124 λ (nm)<br />
<strong>SPARX</strong><br />
CAS - November 8, 2008
TEST FACILITY<br />
MiUR : Strategic Research Programs<br />
CAS - November 8, 2008
<strong>FEL</strong> Electron Beam Requirements:<br />
( )<br />
λ MIN 1+ K 2 2<br />
MIN<br />
λr ∝σδ<br />
γBnK 2<br />
γ Bn L g ∝<br />
K2 K2 energy energy<br />
spread spread<br />
undulator undulator<br />
parameter parameter<br />
γ 32<br />
γ<br />
K Bnn1+ K 2 B ( 2)<br />
n<br />
m<strong>in</strong>imum m<strong>in</strong>imum wavelength<br />
B = n 2I<br />
B<br />
ε 2<br />
tt ε<br />
2<br />
n<br />
ga<strong>in</strong> length<br />
CAS - November 8, 2008<br />
n
CAS - November 8, 2008<br />
SILS - Palermo, June 26, 2008
CAS - November 8, 2008
SPARC 6 Undulator Sections (2 m long)<br />
CAS - November 8, 2008
High Brightness beam<br />
CAS - November 8, 2008
SPARC 150 MeV commission<strong>in</strong>g<br />
Q T1 Q T3<br />
Q T2 RFD<br />
se<br />
pha<br />
Energy<br />
Q T4 QT5<br />
Q QT66 to undulator<br />
quad-scan Slice<br />
ε meas. emittance<br />
meas.<br />
bunch CAS -length November meas.<br />
8, 2008
DRAWBACKS OF CLASSICAL SASE<br />
Time profile has many<br />
random spikes (n= L/L c)<br />
Broad and noisy spectrum at<br />
short wavelengths (X-ray <strong>FEL</strong>)<br />
from DESY (Hamburg) for the SASE experiment (simulation)<br />
CAS - November 8, 2008
Seed Source<br />
e - beam<br />
SEEDING & Harmonic H i Gen. G<br />
U - 1 U - 2<br />
λ res<br />
res λres res/n res res/n<br />
CAS - November 8, 2008
CAS - November 8, 2008
CAS - November 8, 2008
SPARC <strong>in</strong>jector L<strong>in</strong>ac<br />
L<strong>in</strong>ac<br />
15GeV 1.5GeV 24GeV 2.4GeV<br />
11.5 5 GeV beam<br />
2.4 GeV beam<br />
Hard X-ray undulator<br />
undulator<br />
Soft X-ray undulator<br />
VUV-EUV VUV EUV undulator<br />
The <strong>SPARX</strong> l<strong>in</strong>ear accelerator is configured g to provide p the<br />
beam at energies rang<strong>in</strong>g between 0.96 GeV and 2.64 GeV<br />
Three undulator beaml<strong>in</strong>es provide photons <strong>in</strong> energy ranges:<br />
1) VUV-EUV beaml<strong>in</strong>e (40eV/30.5nm - 124 eV/10nm)<br />
2) EUV - Soft X-ray beaml<strong>in</strong>e (88 (88.5eV/14nm 5eV/14nm – 1240eV/1nm)<br />
3) X-ray beaml<strong>in</strong>e (1.28 keV – 2keV)<br />
CAS - November 8, 2008
u sat L L<br />
Set name<br />
Test beam parameters<br />
Low energy gy beam (LE) ( ) High g<br />
(HE)<br />
energy gy beam<br />
Beam energy 0.96 GeV – 1.5GeV 1.92 GeV - 2.64 GeV<br />
Peak Current 1 kA 3.3 kA<br />
Energy spread (slice) 3 10-4 2 10-4 gy p ( )<br />
Emittances (slice) 1.1 mm mrad 1 mm mrad<br />
Twiss 6 m 10 m<br />
Undulator Lengthh<br />
/ Saturation Lenngth<br />
2<br />
1.5<br />
1<br />
1<br />
u sat L Lu sat L L<br />
1<br />
HE beam: 1.92 GeV - 2.64GeV<br />
LE beam: 0.96 0 96 GeV - 1.5 1 5 GeV<br />
0.5<br />
0 5 10 15<br />
Wavelength (nm)<br />
vs vs. the resonant wavelength <strong>in</strong> the <strong>SPARX</strong> EUV-Soft X-ray spectral<br />
range with the HE and the LE beams<br />
CAS - November 8, 2008
CAS - November 8, 2008
QuickTime e un<br />
decompressore C<strong>in</strong>epak<br />
sono necessari per visualizzare quest'immag<strong>in</strong>e.<br />
CAS - November 8, 2008
QQuickTime i kTi e un<br />
decompressore C<strong>in</strong>epak<br />
sono necessari per visualizzare quest'immag<strong>in</strong>e.<br />
CAS - November 8, 2008
Beam ea L<strong>in</strong>es es<br />
40nm - 10 nm<br />
15nm - 5nm<br />
5nm -1nm<br />
1.2nm-0.6nm<br />
CAS Simposio - November 7 marzo 8, 2008<br />
Work <strong>in</strong> progress
Simposio 7 marzo 2008<br />
CAS - November 8, 2008
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