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ดาวน์โหลด All Proceeding - AS Nida

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Table 5. ANOVA with all Main Effects and Interactions.<br />

Sources P-Value for the Etched Rate<br />

A 0.001<br />

B 0.029<br />

C 0.371<br />

A*B 0.791<br />

A*C 0.675<br />

B*C 0.169<br />

A*B*C 0.201<br />

Centre Point 0.162<br />

In order to determine the appropriate setting of the process<br />

variables, the main effects were plotted in Fig. 5. The appropriate levels<br />

of process variables A and B are set at 60 and 3.1, respectively. After an<br />

implementation of the new operating condition, the response of the<br />

etched rate is improved with the deviation of 1.365 and the three sigma<br />

level of 4.1 (Fig. 6)<br />

Mean<br />

Frequency<br />

16.8<br />

15.6<br />

14.4<br />

13.2<br />

12.0<br />

16.8<br />

15.6<br />

14.4<br />

13.2<br />

12.0<br />

40<br />

30<br />

20<br />

10<br />

-1<br />

1<br />

Main Effects Plot for Range<br />

Data Means<br />

A<br />

0<br />

C<br />

2<br />

1<br />

Fig. 5 Main Effect Plots of the Etched Rate Analysis.<br />

0<br />

43.5<br />

Histogram of Etched rate (Main effect)<br />

Normal<br />

45.0<br />

46.5 48.0 49.5<br />

Etched rate<br />

-1<br />

51.0<br />

B<br />

0<br />

52.5<br />

1<br />

Mean 46.84<br />

StDev 1.365<br />

N 216<br />

Fig. 6 Etched Rate Performance Measure at New Process Condition<br />

from the Factorial Design.<br />

55<br />

The method of multiple regression analysis at 95%<br />

confidence interval is then applied for statistically significant process<br />

variables to determine the most preferable fitted equation of associated<br />

process variables of A and B to the response of the etched rate (Table<br />

6). The relationship of the process variables and the response (RER) in<br />

terms of the path of steepest descent is<br />

Expected Response of RER = 63.1-0.171A-13.9B. (3)<br />

Table 6. Regression Model including its Significant Coefficients and<br />

ANOVA Table.<br />

Predictor Coef SE Coef T P-Value<br />

Constant 63.14 17.31 3.65 0.002<br />

A -0.1708 0.0382 -4.47 0.000<br />

B -13.875 5.738 -2.42 0.027<br />

Source DF SS MS F P-Value<br />

Regression 2 135.86 67.932 12.90 0.000<br />

Residual 17 89.557 5.268<br />

Total 19 225.42<br />

The preferable levels of process variables A and B from the<br />

path of steepest descent are 60 and 3.8, respectively (Table 5). When<br />

the new levels of process variables have been applied, the new etched<br />

rate is improved with the deviation of 1.124 and the three sigma level of<br />

3.4 (Fig. 7).<br />

Frequency<br />

30<br />

25<br />

20<br />

15<br />

10<br />

5<br />

0<br />

37<br />

Histogram of Etched rate (Multiple regression)<br />

Normal<br />

38<br />

39<br />

40 41<br />

Etched rate<br />

42<br />

43<br />

Mean 39.50<br />

StDev 1.124<br />

N 216<br />

Fig. 7 Etched Rate Performance Measure at New Process Condition<br />

from the Steepest Descent.

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