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Tellurite And Fluorotellurite Glasses For Active And Passive

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7. Surface properties; MDO 272<br />

7.2. Results<br />

7.2.1. X-ray photoelectron spectroscopy (XPS)<br />

7.2.1.1. XPS of ZnF2 powder<br />

Fig. (7.5) shows a low resolution XPS scan of the as received Alfa Aesar 99.995 % ZnF2<br />

powder [7]. Fig. (7.6) shows a low resolution XPS scan of the ZnF2 powder after<br />

fluorination [7].<br />

CPS<br />

x 10 4<br />

24<br />

22<br />

20<br />

18<br />

16<br />

14<br />

12<br />

10<br />

8<br />

6<br />

CasaXPS<br />

Zn 2p1/2<br />

Zn 2p3/2<br />

Zn 2p<br />

Name<br />

F 1s<br />

O 1s<br />

Zn 2p<br />

Pos.<br />

685.00<br />

532.00<br />

1023.00<br />

FW HM<br />

3.066<br />

2.782<br />

3.371<br />

Area<br />

1500.7<br />

321.0<br />

5429.6<br />

F KLL<br />

At%<br />

53.138<br />

17.187<br />

29.675<br />

1000 900 800 700 600<br />

Binding Energy (eV)<br />

Fig. (7.5): Wide scan XPS spectrum of the as-received ZnF2 powder [7].<br />

F 1s<br />

O 1s

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