Tellurite And Fluorotellurite Glasses For Active And Passive

5. Crystallisation studies; MDO 148
Glass melting
During glass melting the melt volatilised, particularly for the fluorotellurite melts, due to
the presence of volatile fluoride compounds. The deposit left on the silica liner and lid
was collected after melting glass MOF005 (70TeO2-10Na2O-20ZnF2, mol. %) for 12
hours at 800°C in the glovebox under nitrogen. Fig. (5.9) shows the XRD trace of this
deposit.
Lin (Counts)
1500
1400
1300
1200
1100
1000
900
800
700
600
500
400
300
200
100
0
d=4.03809
d=3.37720
d=3.08511
d=2.96683
d=2.39384
d=2.06142
d=1.89726
d=1.86598
d=1.69532
d=1.65589
10 20 30 40 50 60 70 80 90 100
2-Theta - Scale
lindep - File: Melt_Deposit.RAW - Type: 2Th/Th locked - Start: 10.000 ° - End: 100.000 ° - Step: 0.020 ° - Step time: 1. s - Temp.: 25 °C (Room) - Time Started: 0 s - 2-Theta: 10.000 ° - Theta: 5.000 ° - Aux1:
Operations: Import
42-1365 (*) - Paratellurite, syn - TeO2 - Y: 50.00 % - d x by: 1. - WL: 1.54056 - Tetragonal - a 4.81011 - b 4.81011 - c 7.6122 - alpha 90.000 - beta 90.000 - gamma 90.000 - Primitive - P41212 (92) - 4 - 176.
Fig (5.9): XRD trace of deposit left on the silica liner and lid after melting glass MOF005
(70TeO2-10Na2O-20ZnF2, mol. %) for 12 hours at 800°C in glovebox under nitrogen (⎯
JCPDS card number 42-1365: TeO2, tetragonal, P41212).
The deposit was identified using JCPDS card number 42-1365: TeO2, tetragonal, space
group P41212. Table (5.7) shows the ten most intense peaks with corresponding 2θ
(observed and theoretical) and Miller indices.
d=1.51705
d=1.48850
d=1.47395
d=1.26612
d=1.25684
d=1.18642