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Tellurite And Fluorotellurite Glasses For Active And Passive

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5. Crystallisation studies; MDO 138<br />

and<br />

E M = d sinθ<br />

(5.3)<br />

2<br />

2<br />

1<br />

E N = d sinθ<br />

(5.4)<br />

2<br />

Hence, the total path difference equals 2dsinθ which should be integral multiples of λ:<br />

n λ = 2d sinθ<br />

(5.5)<br />

This is known as the Bragg equation.<br />

The powder diffractometer<br />

Originally powder-XRD was performed using the powder photographic method, where<br />

the whole diffraction pattern is recorded simultaneously on a photographic film. This<br />

method was tedious as the film had to be exposed to the X-ray beam for long times, and<br />

there were problems associated with developing the film [1]. This has been overcome by<br />

the powder diffractometer technique. The diffractometer has the advantage of higher<br />

resolution by recording small ranges of 2θ on an expanded scale. The diffraction pattern<br />

is scanned by a counter device (Geiger proportional or scintillation counter) or a solid

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