Tellurite And Fluorotellurite Glasses For Active And Passive
Tellurite And Fluorotellurite Glasses For Active And Passive Tellurite And Fluorotellurite Glasses For Active And Passive
Glossary; MDO SD = standard deviation SE = secondary electron SEM = scanning electron microscopy σ = stress σn = photoelectric cross-section of species n t = time T = temperature T0 = temperature parameter for viscosity modelling tbp = trigonal bipyramid Tc = peak crystallisation temperature TEC = thermal expansion coefficient TEM = transmission electron microscope Tf = fictive temperature Tg = glass transition temperature Tl = liquidus temperature Tm = melting temperature TMA = thermal mechanical analysis tn = time on the TTT nose Tn = corresponding temperature to tn on the TTT nose Tnd = preform neck down temperature tp = trigonal pyramid Ts = solidus temperature Tss = steady state fibre drawing temperature TTT = time-temperature-transformation (diagram / plot) Tx = onset of crystallisation temperature TZN = TeO2-Na2O-ZnO Tη = temperature corresponding to a viscosity of 10 4.5 Pa.s τc = cation valence u = crystal growth rate UV = ultraviolet υ = quantum number v = crack velocity V = volume VA = volume of acid / alkali species in solution Vtotal = total volume of acid / alkali solution Vdw,= volume of distilled water in an acid / alkali solution V0 = volume of glass containing 1 g.atom of oxygen VFT = Vogel-Fulcher-Tamman (viscosity model) ϖ = fundamental frequency Wd = working distance in SEM WDM = wavelength division multiplexing ω = angular frequency x = depth XRD = X-ray diffraction XRF = X-ray fluorescence XPS = X-ray photoelectron spectroscopy Y = Young’s modulus viii
Glossary; MDO Ψ = complex dielectric function relating to the ellipticity of reflected light in ellipsometry calculation Z = atomic number ζn = fraction of photoelectric events which take place without intrinsic plasmon excitation in species n ix
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- Page 3 and 4: Abstract Glasses systems based on T
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Glossary; MDO<br />
Ψ = complex dielectric function relating to the ellipticity of reflected light in ellipsometry calculation<br />
Z = atomic number<br />
ζn = fraction of photoelectric events which take place without intrinsic plasmon excitation in species n<br />
ix