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Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

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(a) (b)<br />

Figure 2.8(a). Metalized photo-paternable silicone bumps and (b). Stencil printed silicon bumps<br />

[48]<br />

Another stress release method was developed by the Fujitsu Co. by <strong>for</strong>ming high copper<br />

posts to increase the gap between the chip and PCB. This chip-sized package is marketed by the<br />

trademark name SuperCSP [46]. Figure 2.9 shows a cross-sectional view and layer structure of<br />

this package. The processes of making the SuperCSP involve several main steps such as the<br />

redistribution traces and metal post <strong>for</strong>ming, encapsulating the wafer, and peeling the film. First<br />

the peripheral pads on the wafer are rearranged in a real array pattern after photolithographic<br />

plating. About 100 µm high metal posts are then fabricated on the wafer. After encapsulating the<br />

entire surface of the wafer, a package having the same size as the chip is fabricated using a<br />

wafer-level packaging method. The connecting portion of copper post and solder ball has a<br />

strong structure that can tolerate the stress because solder balls catch hold of the entire surface of<br />

copper posts, which stick out from the encapsulant and have a mound-like structure [49].<br />

25

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