Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ... Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

etd.auburn.edu
from etd.auburn.edu More from this publisher
09.06.2013 Views

still over-estimated by approximately 20%. As the Solderbrace material is still new, further investigation is required to determine its exact material properties. In addition to material properties deviations may result from various model parameters such as element type, or shape and size. Characteristic life Na Table 5.5 Summary of the characteristic life Experimental Result Prediction Result 510 cycles 613 cycles 118

CHAPTER 6 CONCLUSIONS Wafer level chip scale package (WLCSP) designs have been used in many consumer products, and thus they are competitive in cost, size, yield, and technology. Solder joint reliability is a major concern for advanced WLCSPs. Typical stress-relieving methods such as capillary underfills and molding compounds have not been the preferred solutions due to the extra packaging cost they bring into the assembly process. Instead, successful low cost reliability solutions have generally been the adaptation of wafer level backend packaging processes such as modification of the redistribution layer materials, solder selection, or metal pad thickness. However, the increased performance is limited. In this research, a cost effective solution to WLCSP reliability improvement can be enabled through wafer level coatings (SolderBrace coating). This new approach is presented to reexamine the final passivation layer as more than a dielectric, but also a partial underfill. SolderBrace coating adds a mechanical buffer to the front side of the WLCSP and delivers improved reliability with conventional tools, short process times and lower costs. Test WLCSPs, including the SolderBrace coated WLCSPs and standard non-coated WLCSPs, were designed and fabricated with known standard fabrication procedures. The processing of the SolderBrace coatings was achieved by two different methods: Coating-type solder bracing and Maskless printing over solder balled wafer. These coatings were low 119

CHAPTER 6<br />

CONCLUSIONS<br />

<strong>Wafer</strong> level chip scale package (WLCSP) designs have been used in many consumer<br />

products, and thus they are competitive in cost, size, yield, and technology. Solder joint<br />

reliability is a major concern <strong>for</strong> advanced WLCSPs. Typical stress-relieving methods such as<br />

capillary underfills and molding compounds have not been the preferred solutions due to the<br />

extra packaging cost they bring into the assembly process. Instead, successful low cost reliability<br />

solutions have generally been the adaptation of wafer level backend packaging processes such as<br />

modification of the redistribution layer materials, solder selection, or metal pad thickness.<br />

However, the increased per<strong>for</strong>mance is limited.<br />

In this research, a cost effective solution to WLCSP reliability improvement can be<br />

enabled through wafer level coatings (SolderBrace coating). This new approach is presented to<br />

reexamine the final passivation layer as more than a dielectric, but also a partial underfill.<br />

SolderBrace coating adds a mechanical buffer to the front side of the WLCSP and delivers<br />

improved reliability with conventional tools, short process times and lower costs.<br />

Test WLCSPs, including the SolderBrace coated WLCSPs and standard non-coated<br />

WLCSPs, were designed and fabricated with known standard fabrication procedures. The<br />

processing of the SolderBrace coatings was achieved by two different methods: Coating-type<br />

solder bracing and Maskless printing over solder balled wafer. These coatings were low<br />

119

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!