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Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

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cycles <strong>for</strong> the crack to propagate across a solder joints diameter. The number of cycles be<strong>for</strong>e<br />

crack initiation N0 is calculated as:<br />

N CW 0 1<br />

C2<br />

ave<br />

106<br />

(5-9)<br />

where ∆Wave is the incremental inelastic energy per cycle at the stable cycle, and at the solder<br />

joint in concern, C1 and C2 are constants. The crack growth rate (da/dN) per cycle was also<br />

calculated in the similar equation as:<br />

d dN C W<br />

(5-10)<br />

C4<br />

a 3 ave<br />

and the total number of cycles be<strong>for</strong>e failure (Na) can thus be written as:<br />

a<br />

Na N (5-11)<br />

0 d dN<br />

a<br />

where a is the total distance the crack has to travel be<strong>for</strong>e failure. For a solder joint, it can be<br />

conveniently interpreted as the solder diameter at the solder die interface. The viscoplastic strain<br />

energy density ∆Wave (in psi) is defined by averaged quantity across the element along the solder joint<br />

interface where the crack propagates. Because Darveauxs model was developed in English Unit, the unit<br />

of a and ∆Wave have been converted from a Metric Unit (mm and MPa) to an English Unit (in and psi)<br />

during the calculation of the fatigue life prediction. ∆Wave was introduced and defined by:<br />

W n<br />

<br />

i1<br />

ave n<br />

dWV<br />

<br />

i1<br />

V<br />

i i<br />

i<br />

(5-12)<br />

where dWi is the incremental inelastic energy of element i at the first stable cycle, n is the total<br />

number of elements considered and Vi is the calculated volume of element i.

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