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Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

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5.1.2 Material Properties<br />

Many packaging materials have temperature and time dependent behavior, which is one of<br />

the most important considerations in the simulation. Although it sounds reasonable to input as<br />

much in<strong>for</strong>mation about a material as possible in a model, the calculating time required <strong>for</strong> actual<br />

analysis puts a limitation on what should be included. There<strong>for</strong>e, prior to implementing a<br />

constitutive model <strong>for</strong> a specific material, several important aspects need to be carefully<br />

considered. First is the analysis objective. The main focus should be put on the most critical<br />

response the analyst is interested in rather than other materials that may seriously slow down the<br />

analysis time without significant accuracy improvement. Second, the simulation requires<br />

modeling the material behavior, not the actual material. For example, the creep behavior of<br />

eutectic Sn/Pb solder can occur at room temperature, but not under the circumstance with high<br />

loading and high rate of strain. As a result, in order to avoid inefficiencies in the analysis, there is<br />

no need to predict solder de<strong>for</strong>mation caused by the rapid mechanical cycling at room<br />

temperature if the rate of loading is high enough to cause no de<strong>for</strong>mation, while it is essential to<br />

include the creep behavior when simulating fatigue due to thermal cycling [83, 86].<br />

5.1.3 Constitutive Models <strong>for</strong> SnAgCu Solder<br />

A constitutive model is an approach to mathematically describe the relationship between<br />

strain, stress and other state variables. The material constitutive model plays a very important<br />

role in the development of thermomechanical models <strong>for</strong> microelectronic packaging assembly.<br />

Two types of de<strong>for</strong>mation (elastic and inelastic) are <strong>for</strong>med inside the solder alloy when it is<br />

under thermomechanical loading. Since the inelastic de<strong>for</strong>mation consists of time-dependent<br />

99

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