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Enhanced Polymer Passivation Layer for Wafer Level Chip Scale ...

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Figure 2.11 Schematic process flow of the double ball redistribution and<br />

Bumping technology ……………………………………………………………...28<br />

Figure 2.12 <strong>Polymer</strong>Collar WLP (a), and a cleaved section of <strong>Polymer</strong> Collar WLP (b) ........ 30<br />

Figure 2.13 Process flow of a laser ablated coating-type wafer level solder brace ................. .31<br />

Figure 2.14 Process flow of a back grind and double bump coating-type wafer level<br />

solder brace ............................................................................................................. 32<br />

Figure 2.15 Application method of SolderBrace by photo definition ...................................... 32<br />

Figure 2.16 Cross section of a WLCSP 250µm solder bump supported by the thick<br />

front-side passivation SolderBrace ......................................................................... 33<br />

Figure 3.1 6mm x 6mm daisy chained test die ........................................................................... 36<br />

Figure 3.2 <strong>Wafer</strong> of WLCSPs without SolderBrace coating and WLCSP close-up view ......... 37<br />

Figure 3.3 Fabrication Process Flowof Die A ........................................................................... 38<br />

Figure 3.4 Fabrication Process Flow of Die B .......................................................................... 39<br />

Figure 3.5 Delaminated surface coatings (a) and good surface coatings (b) .............................. 48<br />

Figure 3.6 Process flow of UV defined SolderBrace bumping sites and ball placement .......... 50<br />

Figure 3.7 SolderBrace film thicknesses as a function of spin speed ........................................ 51<br />

Figure 3.8 Pattern <strong>for</strong> SolderBrace coating ................................................................................ 53<br />

Figure 3.9 Exposure time vs. Aperture Size .............................................................................. 54<br />

Figure 3.10 Cross-section of the open vias ................................................................................ 55<br />

Figure 3.11 Supported structure around solder balls <strong>for</strong>med by no-flow flux .......................... 56<br />

Figure 3.12 Solder Ball Placement Method by DEK .................................................................. 61<br />

Figure 3.13 <strong>Wafer</strong> <strong>Level</strong> Solder Sphere Transfer Process Flow .............................................. 62<br />

Figure 3.14 Carrier plate made by etched Si wafer. ................................................................. 63<br />

Figure 3.15 Solder ball placement method developed in this research ...................................... 64<br />

Figure 3.16 Schematic of the four zones of reflow soldering ..................................................... 65<br />

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