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KURENAI : Kyoto University Research Information Repository

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In the entrainment regime<br />

of entrainment, the amplitude<br />

parameter for the description<br />

slightly modified by using the<br />

as<br />

The motion<br />

shear flow<br />

T. = 0.005 1 + C<br />

g h<br />

0.005 C<br />

g h<br />

of the wave<br />

model (Ishii<br />

Ti= C wuf of.(19)<br />

v<br />

1<br />

PqJ 2<br />

g<br />

crest<br />

and<br />

beyond the critical gas velocity for the onset<br />

of the wave crest should be the most important<br />

of T.. Therefore, the above correlation is<br />

1<br />

wave amplitude instead of the film thickness<br />

1 .2<br />

P gJ g<br />

with respect to<br />

Grolmes [14]) as<br />

the film may<br />

(18)<br />

be expressed by a<br />

On the other hand, interfacial shear force can also be expressed by the liquid<br />

friction factor as<br />

2<br />

Ti = fiPZvf (20)<br />

From Eqs. (19) and (20) one can eliminatetvf and obtain an expression for the<br />

amplitude as<br />

Pf<br />

a = C Pf<br />

w PfTi<br />

1<br />

"V=7i<br />

A typical liquid friction factor<br />

film thickness given by Hughmark<br />

number regime of interest,<br />

Substituting<br />

interfacial<br />

= 1.13 Re f0.25<br />

Eqs. (21) and<br />

shear force can<br />

can be<br />

[28].<br />

obtained<br />

Thus for<br />

(22) into Eq. (18) a<br />

be derived.<br />

162<br />

(21)<br />

from the correlation for a<br />

a relatively high Reynolds<br />

following<br />

(22)<br />

expression for the

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