TEST REPORT - hotline-int.ch

KTL
Korea Testing Laboratory
222-13, Guro-Dong Guro-Gu Seoul 152-848 Korea Tel.:+82-2-860-1114 Fax.:+82-2-860-1116
TEST REPORT
Applicant : Binatone Telecom Plc.
Address : Unit 1, Ponders End Industrial Estate, East Duck
Lees Lane, Enfield, Middlesex, EN3 7SP,
United Kingdom
Manufacturer : Binatone Electronics International Ltd.
Address : Floor 23A, 9 Des Voeux road West, Shenung Wan,
Hong Kong
Test Item : DECT (Handset)
Model / Type : e800
Standard : ETSI EN 301-489-1 V1.4.1(2002)
ETSI EN 301-489-6 V1.2.1(2002)
Test results : POSITIVE
Date of application : June 26, 2004 ~ June 29, 2004
Issued date : June 30, 2004
Tested by Reviewed by
Soun-Kweon Seol Hee-Soo Kim
Senior Engineer Telecommunication Team Manager
THE TEST RESULTS only responds to the test sample.
This test report shall not be reproduced except in full without approval of the KTL.
KOREA TESTING LABORATORY
Report No.: 04 - 103 – 065-1-PP Page 1 of 23 Pages
FG101-02-01

Ref. Report No. 04 - 103 – 065-1-PP Page 2 of 23 Pages
TABLE OF CONTENTS
1. General Informations --------------------------------------------------------------------------------------------- 3
2. Test Regulations ------------------------------------------------------------------------------------------------4-5
3. Environmental Conditions and Uncertainty ---------------------------------------------------------6
4. Test Conditions -------------------------------------------------------------------------------------------------- 7-12
5. Test Results ------------------------------------------------------------------------------------------------------13-19
6. Test Data
6.1 Emission Test Data
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr
Page
1)Conducted Emissions (150 kHz - 30 MHz) -----------------------------------------------------------------N/A
2)Radiated Emissions (30 MHz - 1000 MHz) ----------------------------------------------------------------N/A
3)Harmonic Current Emissions ----------------------------------------------------------------------------------N/A
4)Voltage Fluctuation and Flicker -------------------------------------------------------------------------------N/A
6.2 Immunity Test Data
1)Electrostatic Discharge ---------------------------------------------------------------------------------------20-22
2)RF Electromagnetic Field -------------------------------------------------------------------------------------23
3)Fast Transients Common Mode ------------------------------------------------------------------------------N/A
4)Surges --------------------------------------------------------------------------------------------------------------N/A
5)Conducted Disturbances(RF Common Mode) -----------------------------------------------------------N/A
6)Voltage Dips and Interruptions -------------------------------------------------------------------------------N/A

Ref. Report No. 04 - 103 – 065-1-PP Page 3 of 23 Pages
1. GENERAL INFORMATIONS
1.1 Applicant (Client)
Name Binatone Telecom Plc.
Address
Unit 1, Ponders End Industrial Estate, East Duck Lees Lane,
Enfield, Middlesex, EN3 7SP, United Kingdom.
Contact Person Paul Tsui
Telephone No. +44 20 8344 8888
Facsimile No. +44 20 8344 8877
E-mail address paultsui@binatonetelecom.com.hk
1.2 Equipment (EUT)
Name Digital Enhanced Cordless Telecommunication
Description Handset
Model Name e800
Brand Name Binatone
Serial No. 0000001
Radio Frequency Range 1.880 GHz – 1.900 GHz
Modulation GFSK
Manufacturer Name Binatone Electronics International Ltd.
Manufacturer Address Floor 23A, 9 Des Voeux road West, Shenung Wan, Hong Kong
Additional Information
O Input Power :
DC 1.2 V(Rechageable battery : Ni-MH, 300mA)
O External Port :
1.3 Testing Laboratory
Test Method
ETSI EN 301-489-1 V1.4.1(2002),
ETSI EN 301-489-6 V1.2.1(2002)
Testing Place
Korea Testing Labortory (KTL)
222-13 Guro-dong, Guro-Gu, Seoul 152-848 Korea
Test Engineer Soun-Kweon, Seol
Telephone number +82 2 860 1599
Facsimile number +82 2 860 1468
E-mail address skseol@ktl.re.kr
Other Comments -
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 4 of 23 Pages
2.1 Emission Test Regulations
2. TEST REGULATIONS
The tests were performed according to following regulations :
o - EN 50081-1 / 2.1991
o - EN 50081-2 / 1991
-----------------------------------------------------------------------------
o - EN 55011 / 3.1991 o - Group 1 o - Group 2
o - class A o - class B
o - EN 55013 /1990+A12/1994+A13/1996+A14/1999
o - EN 55014-1 / A1:1997 o - Household appliances and similar
o - Tools
o - Semiconductor devices
o - Click noise
o - EN 55014 / A2:1990
o - EN 55015 / A1:1990
o - EN 55015 / 12.1993
o - EN 55022 / 1997+A1/2000 o - class A o - class B
o - prEN 55103-1 / 3.1995
o - EN 60601-1-2 / 4.1994
o - EN 61000-3-2 / 2000
o - EN 61000-3-3 / 1995+A1/2001
o - prEN 61000-3-4 / 1995
o - prEN 61000-3-5 / 1994
o - prEN 61000-3-6
o - prEN 61000-3-7
o - EN 60555 Part 2 / 4.1987
o - EN 60555 Part 3 / 4.1987
o - IEC 1000-3-2
o - IEC 1000-3-4
o - IEC 1000-3-5
o - IEC 1000-3-6
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 5 of 23 Pages
2.2 Immunity Test Regulations
The tests were performed according to following regulations :
o - EN 50082-1 / 1992
o - EN 50082-1 / 1997
o - EN 50082-2 / 1995
o - EN 55020 / 1994 o A11/1996 + A13/1999 + A14/1999
o A12/1999
-----------------------------------------------------------------------------
- EN 61000-4-2 / 3.1995 + A1/4.1998 + A2/2.2001
- EN 61000-4-3 / 9.1996 + A1/8.1998 + A2/2.2001
o - EN 61000-4-4 / 3.1995 + A1/2.2001 + A2/8.2001
o - EN 61000-4-5 / 3.1995 + A1/2.2001
o - EN 61000-4-6 / 7.1996 + A1/2.2001
o - EN 61000-4-7 / 1994
o - EN 61000-4-8 / 9.1993 + A1/2.2001
o - EN 61000-4-9 / 5.1994
o - EN 61000-4-10 / 5.1994
o - EN 61000-4-11 / 8.1994 + A1/2.2001
o - ENV 50140 / 8.1993
o - ENV 50141 / 2.1993
o - ENV 50142 / 1.1994
o - ENV 50204 / 3.1995
-----------------------------------------------------------------------------
o - IEC 801-2 / 4.1991
o - IEC 801-3 / 1984
o - IEC 801-4 / 1988
o - IEC 801-5 / 1.1993 (draft)
o - IEC 801-6 / 12.1992 (draft)
o - IEC 61000-4-2 / 4.2001
o - IEC 61000-4-3 / 4.2001
o - IEC 61000-4-4 / 1.1995 + A1/11.2000 + A2/7.2001
o - IEC 61000-4-5 / 4.2001
o - IEC 61000-4-6 / 4.2001
o - IEC 61000-4-8 / 3.2001
o - IEC 61000-4-11 / 3.2001
o - IEC 801-3 / 1984
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 6 of 23 Pages
3. E N V I R O N M E N T A L C O N D I T I O N S AND UNCERTAINTY
3.1 Environmental Conditions
Temperature: 25~29 °C
__________
Humidity 44~47 %
_________
Atmospheric pressure 1005~1012 hPa
_______________
3.2 Measurement Uncertainty
The data and results referenced in this document are true and accurate. The reader is cautioned that
there may be errors within the calibration limits of the equipment and facilities that can account for a
nominal measurement error of ±4 dB. Furthermore, component and process variability of devices similar
to that tested may result in additional deviation. The manufacturer has the sole responsibility of continued
compliance of the device.
3.3 Symbol Definitions
- Applicable
o - Not applicable
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 7 of 23 Pages
4.1 Operation - mode of the E.U.T.:
4. TEST CONDITIONS
The equipment under test was operated during the measurement under following conditions:
- Standby
- Practice operation (Link Mode)
- Loop Back Mode(Measuring BER With CMD 60)
4.2 Configuration for Measurement:
Following periphery devices and interface cables were connected during the measurement:
o - Type :
______________________________ ______________________________
o - customer specific interconnecting cables :
4.3 Conducted Emissions : Applicable Not Applicable
The measurement of the conducted emissions (interference voltage) was performed in the shielded
compact chamber.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
Used test instruments :
o - Test Receiver, ESH3 Rohde & Schwarz No.: 9110096-1
o - EMI Test Receiver, ESI7 Rohde & Schwarz No.: 0010001-I
o - LISN, 3825/2 EMCO No.: 921000C-I
o - Passive Probe, ESH-Z3 Rohde & Schwarz No.: 9210208
o - LISN, 8128(3φ) Schwarzbeck No.: 9210039
o - CDN 801-T2 FCC No.: 951016C-C
o - Plotter, 7470A Hewlett Packed No.: 891000C-I
o - Spectrum Monitor, EZM Rohde & Schwarz No.: 9110096-2
o - Monitor, VM5122 VICON No.: 921002C-I
o - Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
All used test-instruments as well as the test-accessories are calibrated regularly.
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 8 of 23 Pages
4.4 Radiated Emissions : Applicable Not Applicable
The measurement of the radiated emission(electric field) in the frequency range of 30MHz~1000MHz
is not applicable.
Test location :
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
o - Open test-site 1
o - Open test-site 2
Test distance :
o – 3 meters
o – 10 meters
o – 30 meters
Used test instruments :
o - Test Receiver, ESVS30 Rohde & Schwarz No.: 9110096
o - Spectrum Analyzer, 8563A Hewlett Packard No.: 931003C-I
o - RF Amplifier, 8347A Hewlett Packard No.: 941000C-I
o - RF Amplifier, 8449B Hewlett Packard No.: 9210122
o - Tuned Dipole Ant, VHA9103 Schwarzbeck No.: 931000A-I
o - Tuned Dipole Ant, UHA9105 Schwarzbeck No.: 931001A-I
o - Biconical Ant, BBA9106 Schwarzbeck No.: 931000C-I
o - Log Periodic Ant, 3146 EMCO No.: 931003C-I
o - Horn Ant, 3115 EMCO No.: 9210203
All used test-instruments as well as the test-accessories are calibrated
regularly.
4.5 Harmonics and Voltage Fluctuations/Flicker : Applicable
Not Applicable
The measurement of the harmonics and voltage fluctuations was performed in a shielded room.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
Used test instruments :
o - Waveform source, EP72 KeyTek No.: 951000C-I
o - Power supply, PCR 4000L KIKUSUI No.: 951002C-I
o - Harmonic/Flicker, ERI1 KeyTek No.: 951001C-I
o - Controller, ECAT KeyTek No.: 941000C-C
o - Atmosphere System EMPEX No.: 961000C-C
o - Telephone Analyzer,DD5601CI Jung Jin No.: 0010213
All used test-instruments as well as the test-accessories are calibrated regularly.
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 9 of 23 Pages
4.6 Electrostatic Discharge : Applicable Not Applicable
The measurement of the immunity against electrostatic discharge(ESD) was performed in a shielded
compact chamber.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
- Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded compact chamber, 7.0 m(L) × 5.0 m(W) × 2.8 m(H)
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
Used test instruments :
- ESD Simulator, MZ-15/EC KeyTek No.: 9410236
- IEX OMNI-TIP, MZ TPC-2 KeyTek No.: 9410236-1
- VCP, HCP KeyTek No.: 9410236-2
o - Power Supply, PAC-800-1 KeyTek No.: 9410236-3
- Atmosphere System KeyTek No.: 961000C-C
- Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
All used test-instruments are calibrated regularly
4.7 RF Electromagnetic Field : Applicable Not Applicable
The measurement of the immunity against radiated fields was performed in a shielded compact
chamber.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
- Shielded compact chamber, 7.0 m(L) × 5.0 m(W) × 2.8 m(H)
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
Used test instruments :
- Amplifier, 50S1G4A Amplifier Research No.: 0110101
- Amplifier, 200W1000M1 Amplifier Research No.: 971002C-C
- Signal Generator, SMT02 Rohde & Schwarz No.: 951003C-C
- Millivoltmeter Rohde & Schwarz No.: 951004C-C
- Directional Coupler Rohde & Schwarz No.: 951005C-C
- Insertion unit, URV5-Z2 Rohde & Schwarz No.: 951006C-C
- Digital Radiocommunication Tester, CMD 60 Rohde & Schwarz No.: -
o - E Field Generator, AT3000 Amplifier Research No.: 951007C-C
o - Log-Periodic Ant., HL 023A1 Rohde & Schwarz No.: 891001C-C
o - Log-Periodic Ant., AT1080 Amplifier Research No.: 951008C-C
o - Biconical Ant. 3109 EMCO No.: 951009C-C
- Hyb. Log-Peri. Ant., HLP-2603 EMCA No.: 011001C-C
- Iso.Field Probe, HI-4433-GRE Holaday No.: 011002C-C
- Video System SIEMENS No.: 951012C-C
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 10 of 23 Pages
- Atmosphere System EMPEX No.: 961000C-C
- Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
All used test-instruments are calibrated regularly.
4.8 Fast Transients Common Mode : Applicable Not Applicable
The measurement of the immunity against electrical fast transients (Burst) was performed in a
shielded compact chamber.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded compact chamber, 7.0 m(L) × 5.0 m(W) × 2.8 m(H)
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
Used test instruments :
o - EFT Source, E433 KeyTek No.: 951013C-C
o - Controller, ECAT KeyTek No.: 941000C-C
o - Capacitive Clamp, CCL-4/S KeyTek No.: 951014C-C
o - Ultra Compact Simulator,UCS500-M EM TEST No.: 9810085
o - Capacitive Clamp, HFK EM TEST No.: 981000C-2
o - Atmosphere System EMPEX No.: 961000C-C
o - Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
o - 3 Phase Coupling Network,CNI503 EM TEST No.: 9810085
All used test-instruments are calibrated regularly.
4.9 Surges : Applicable Not Applicable
The measurement of the immunity against surge transients was performed in a shielded room.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded compact chamber, 7.0 m(L) × 5.0 m(W) × 2.8 m(H)
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
Used testinstruments :
o - Surge Network, E501 KeyTek No.: 941001C-C
o - Coupler/Decoupler, E553 KeyTek No.: 941002C-C
o - Telecom Coupler/Decoupler, E573 KeyTek No.: 941003C-C
o - Controller, ECAT KeyTek No.: 941000C-C
o - Ultra Compact Simulator,UCS500-M EM TEST No.: 9810085
o - Atmosphere System EMPEX No.: 961000C-C
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 11 of 23 Pages
o - Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
o - 3 Phase Coupling Network,CNI503 EM TEST No.: 9810085
All used test-instruments are calibrated regularly
4.10 Conducted Disturbances(RF Common Mode) : Applicable
Not Applicable
The measurement of the immunity against conducted disturbance, induced by radio frequency fields
above 9 kHz was performed in the shielded room.
Test location :
o - Shielded room no. 1, 5.0m(L)×3.8m(W)×2.4m(H)
o - Shielded room no. 2, 6.5m(L)×3.0m(W)×2.5m(H)
o - Shielded room no. 3, 3.7m(L)×4.0m(W)×2.4m(H)
o - Shielded room no. 4, 5.3m(L)×4.0m(W)×2.4m(H)
o - Shielded compact chamber, 7.0m(L)×5.0m(W)×2.8m(H)
o - Anechoic chamber, 8.2m(L)×6.0m(W)×6.7m(H)
Used test instruments :
o - Amplifier, 250L Amplifier Research No.: 951001C-C
o - Signal Generator, SMT01 Rohde & Schwarz No.: 951003C-C
o - Millivoltmeter, URV5 Rohde & Schwarz No.: 951004C-C
o - Directional Coupler,3000.0351 Rohde & Schwarz No.: 951005C-C
o - Insertion Unit, URV 5-Z2 Rohde & Schwarz No.: 951006C-C
o - Attenuator Electronics No.: 951015C-C
o - CW simulator, CWS500A EM TEST No.: 981001C-C
o - Attenuator, 6/75 EM TEST No.: 981001C-1
o - Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
coupling/decoupling network
o - 01. CDN 801-T2 FCC No.: 951016C-C
o - 02. CDN 801-T4 FCC No.: 951017C-C
o - 03. CDN 801-M1-25 FCC No.: 951018C-C
o - 04. CDN 801-M2-25 FCC No.: 951019C-C
o - 05. CDN 801-M3-25 FCC No.: 951020C-C
o - 06. CDN 801-M4-25 FCC No.: 951021C-C
o - 07. CDN 801-AF2 FCC No.: 951022C-C
o - 08. CDN 801-AF3 FCC No.: 951023C-C
o - 09. CDN 801-AF4 FCC No.: 951024C-C
o - 10. CDN 801-AF7 FCC No.: 951025C-C
o - 11. CDN 801-AF8 FCC No.: 951026C-C
o - 12. CDN 801-S15 FCC No.: 951027C-C
o - 13. CDN 801-S25 FCC No.: 951028C-C
injection clamp
o - 14. EM Clamps, 205A FCC No.: 951029C-C
o - 15. RF Current Probe, 140A1 FCC No.: 951030C-C
o - 16. RF Current Probe, 140A2 FCC No.: 951031C-C
o - 17. Ferrite Decoupling Tube FCC No.: 951032C-C
All used test-instruments are calibrated regularly
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 12 of 23 Pages
4.11 Voltage Dips and Interruptions : Applicable Not Applicable
The measurement of the influence of AC variations and interruptions was performed in a shielded
room.
Test location :
o - Shielded room no. 1, 5.0 m(L) × 3.8 m(W) × 2.4 m(H)
o - Shielded room no. 2, 6.5 m(L) × 3.0 m(W) × 2.5 m(H)
o - Shielded room no. 3, 3.7 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded room no. 4, 5.3 m(L) × 4.0 m(W) × 2.4 m(H)
o - Shielded compact chamber, 7.0 m(L) × 5.0 m(W) × 2.8 m(H)
o - Anechoic chamber, 8.2 m(L) × 6.0 m(W) × 6.7 m(H)
Used test instruments :
o - Voltage swell/dip/ KeyTek No.: 961001C-C
interruption source,EP61
o - Controller, ECAT KeyTek No.: 941000C-C
o - Atmosphere System EMPEX No.: 961000C-C
o - Telephone Analyzer,DD5601CID Jung Jin No.: 0010213
o - Ultra Compact Simulator,UCS500-M EM TEST No.: 9810085
o - 1 Phase Motor Driven AC Source,MV2616 EM TEST No.: 9810085
All used test-instruments are calibrated regularly.
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 13 of 23 Pages
5. TEST RESULTS
5.1 Conducted Emissions (150 kHz - 30 MHz)
The requirements are O MET O NOT MET NOT APP.
Min. limit margin - dB at - MHz
_______ _______
Max. limit exceeding - dB at - MHz
_______ _______
Remarks: Please, refer to the attached data on page .
5.2 Radiated Emissions (30 MHz - 1000 MHz)
The requirements are O MET O NOT MET NOT APP.
Min. limit margin - dB at - MHz
_______ _______
Max. limit exceeding - dB at - MHz
_______ _______
Remarks: Please, refer to the attached data on page .
5.3 Harmonic Current Emissions
The requirements are O MET O NOT MET NOT APP.
Max. Steady state current - mA at the harmonic, Limit = - mA
_______ _______
Max. Transitory state current - mA at the harmonic, Limit = - mA
_______ _______
Remarks: Please, refer to the attached test data on page .
5.4 Voltage Fluctuation and Flicker
The requirements are O MET O NOT MET NOT APP.
Remarks: Please, refer to the attached test data on page .
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 14 of 23 Pages
5.5 Electrostatic Discharge
The requirements(criterion B) are MET O NOT MET O NOT APP.
The result is bellow:
- no degradation of function - Met Criterion A
(Continuous phenomena of Transceiver)
o - distortion of function - Met Criterion B
(Transient phenomena of Transceiver)
o - error of function - Met Criterion C
o - loss of function - Broken
Test specifications:
Discharge voltage Conducted: o - 1 kV - 2 kV - 4 kV
o - 6 kV o - 8 kV o - kV
Discharge voltage Air: - 2 kV - 4 kV - 8 kV
o - 10 kV o - 12 kV o - kV
Discharge impedance: - 330Ω / 150pF o - 150Ω / 150pF
Discharge factor: - ≥ 1 sec.
Number of discharges: - ≥ 10 at all locations
Kind of discharges: - air discharge - conducted discharge (relay)
- direct - indirect
Polarity: - positive - negative
Location of discharge: o - see drawing in Appendix
- each point on the surface touchable by hand.
- HCP/VCP
- Connector, each sides and etc.
Remarks: The EUT operated as intended during and after the test.
Please, refer to the attached test set-up on page 20 to 22.
5.6 RF Electromagnetic Field
The requirements(criterion A) are MET O NOT MET O NOT APP.
The result is bellow:
- no degradation of function - Met Criterion A
(Continuous phenomena of Transceiver)
o - distortion of function - Met Criterion B
(Transient phenomena of Transceiver)
o - error of function - Met Criterion C
o - loss of function - Broken
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 15 of 23 Pages
Test specifications:
Frequency - range: o - 27 MHz - 500 MHz - 80 MHz - 1000 MHz
o - 9 kHz - 27 MHz -1400 MHz - 2000 MHz
o - 900 MHz o - 895 MHz - 905 MHz
Field strength: o - 1 V/m - 3 V/m
o - 10 V/m o - V/m
Distance of antenna - EUT: o - 1 m - 3 m o - m
Modulation: - AM : 80 % 1 kHz, sine wave
o - FM : % kHz
o - unmodulated
o - Pulse Duty Cycle: 50 % 200 Hz
Frequency step: o - 0.015 decades/sec
- 1 % / 3 sec o - 1% / 1 sec.
Polarization of antenna: - horizontal - vertical o - circular
The Bit Error Rate - Less Than 1 x 10 -3
Remarks: The EUT operated as intended during and after the test.
Please, refer to the attached test set-up on page 23.
5.7 Fast Transients Common Mode
The requirements(criterion B) are O MET O NOT MET NOT APP.
The result is bellow:
o - no degradation of function - Met Criterion A
(Continuous phenomena of Transceiver)
o - distortion of function - Met Criterion B
(Transient phenomena of Transceiver)
o - error of function - Met Criterion C
o - loss of function - Broken
Test specifications:
Pulse amplitude-Power line: o - 1,0 kV o - 2,0 kV
o - 4,0 kV o - kV
Pulse amplitude-Tel line: o - 0,5 kV o - 1,0 kV
o - 2,0 kV o - kV
Burst frequency: o - 2,5 kHz o - 5,0 kHz o - ___
Couplingtime: o - > 60 seconds o - 1 minutes
Coupling method: o - network o - coupling clamp
Polarity: o - positive o - negative
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 16 of 23 Pages
Test points of coupling:
name of lines:
_______________________________________
type of lines: o - shielded o - unshielded
status of lines: o - passive o - active
kind of transmission: o - analogue o - digital
length of lines: o - 3.0 m
name of lines:
___________
type of lines: o - shielded o - unshielded
status of lines: o - passive o - active
kind of transmission: o - analogue o - digital
length of lines: o - longer than 3.0 m
Remarks:
5.8 Surges
The requirements(criterion B) are O MET O NOT MET NOT APP.
The result is bellow:
o - no degradation of function - Met Criterion A
(Continuous phenomena of Transceiver)
o - distortion of function - Met Criterion B
(Transient phenomena of Transceiver)
o - error of function - Met Criterion C
o - loss of function - Broken
Test specifications:
Pulse amplitude-Power line: o - 0,5 kV o - 1,0 kV
o - 2,0 kV o - 4,0 kV
Pulse amplitude-Tel line: o - 0,5 kV o - 1,0 kV
o - 2,0 kV o - 4,0 kV
Source impedance: o - 2Ω + 18µF o - 12Ω + 9µF
o - 42Ω + 0,1µF o - 42Ω + 0,5µF
Number of surges: o - 5 surges/angle o - surges /angle
Angle: o - 0 ° o - 90 °
o - 180 ° o - 270 °
Repetition rate: o - 60 sec. o - sec.
Polarity: o - positive o - negative
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 17 of 23 Pages
Test points of coupling:
name of lines: Main AC/AC Power Adaptor Cable(2 Lines)
_______________________________________
type of lines: o - shielded o - unshielded
status of lines: o - passive o - active
kind of transmission: o - analogue o - digital
length of lines: o - 3.0 m
name of lines: TEL Line
___________
type of lines: o - shielded o - unshielded
status of lines: o - passive o - active
kind of transmission: o - analogue o - digital
length of lines: o - longer than 3.0 m
Remarks:
5.9 Conducted Disturbances(RF Common Mode)
The requirements(criterion A) are O MET O NOT MET NOT APP.
The result is bellow:
o - no degradation of function - Met Criterion A
(Continuous phenomena of Transceiver)
o - distortion of function - Met Criterion B
(Transient phenomena of Transceiver)
o - error of function - Met Criterion C
o - loss of function - Broken
Test specifications:
Frequency - range: o - 0,15 MHz - 80 MHz o - 0,15 MHz - 230 MHz
o - MHz - MHz
Voltage level (EMF): o - 1 V o - 3 V
o - 10 V o - V
Modulation: o - AM : 80 % 1 kHz, sine wave
o - FM : % kHz
o - unmodulated
o - Pulse Duty Cycle: % Hz
Frequency step: o - 0.015 decades/sec
o - 1 % / 3 sec o - 1% / 1 sec.
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 18 of 23 Pages
Test ports and Coupling / Decoupling method :
Ports Tested Coupling and Decoupling Method
Port No. Cable Name Coupling Decoupling
Test points of coupling:
name of lines:
_______________________________________
type of lines: o - shielded o - unshielded
status of lines: o - passive o - active
kind of transmission: o - analogue o - digital
length of lines: o - 3.0 m
name of lines:
___________
type of lines: o - shielded o - unshielded
status of lines: o - passive o - active
kind of transmission: o - analogue o - digital
length of lines: o - longer than 3.0 m
Remarks:
5.10 Voltage Dips and Interruptions
The requirements(criterion B(30% dips), C(60% dips and interruption)) are
The result is bellow: Criterion A (30% dips), C(60% dips and interruption)
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr
O MET O NOT MET NOT APP.
o - no degradation of function - Met Criterion A
(Continuous phenomena of Transceiver)
o - distortion of function - Met Criterion B
(Transient phenomena of Transceiver)
o - error of function - Met Criterion C
o - loss of function - Broken

Ref. Report No. 04 - 103 – 065-1-PP Page 19 of 23 Pages
Test specifications:
Nominal Mains Voltage (VNOM): o - 230 VAC o - VAC o - VDC
Level of reduction(dip): o - 10 ms at 30 % reduction of VNOM
o - 100 ms at 60 % reduction of VNOM
o - 5000 ms at 95% reduction of VNOM
Duration of interruption(0% of VNOM): o - 250 periods o - ms
Voltage fluctuations: o - VNOM + 10% o - VNOM - 10%
Remarks:
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr

Ref. Report No. 04 - 103 – 065-1-PP Page 20 of 23 Pages
6.1 Emission Test Data : N/A
6.2 Immunity Test Data
1) Electrostatic Discharge
6. TEST DATA
ESD
simulator
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr
Model : e800
HCP/VCP
EUT
Ground plane Wooden table,
h = 0.8 m
Test Set-up: Electrostatic Discharge (ESD)
Ground

1
2
3
6
7
Ref. Report No. 04 - 103 – 065-1-PP Page 21 of 23 Pages
The Part of Discharge
[Front Side]
[Rear Side]
Air/Dis.
Contact/Dis
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr
8
4
5

Ref. Report No. 04 - 103 – 065-1-PP Page 22 of 23 Pages
The Result of Test
Dir./Indir. No. The part of Discharge Air/Contact Reference Result Remark
Indirect
Coupling
Direct
Coupling
HCP
Contact
B A -
VCP
Discharge
B A -
1 LCD (None-Metal) Air Dis. B A -
2 Ear Point(None-Metal) Air Dis. B A -
3 Enclosure (None-Metal) Air Dis. B A -
4 Mouth Point(None-Metal) Air Dis. B A -
5 Button (None-Metal) Air Dis. B A -
6 Enclosure (None-Metal) Air Dis. B A -
7
Power Charging
Point(Metal)
Contact
Dis.
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr
B A -
8 Hole(None-Metal) Air Dis. B A -
9 - - - - -
10
11
12
13
14
15

Ref. Report No. 04 - 103 – 065-1-PP Page 23 of 23 Pages
2) RF Electromagnetic Field
Amplifier room
Amp.
Amp.
Test
Instruments
Monitoring
system
CMD 60
Control room
Hybrid logperiodic
Ant.
Video camera
Ferrite Tile Absorbers
KOREA TESTING LABORATORY, 222-13 Guro-Dong Guro-Gu Seoul 152-848 Korea
Tel: +82 2 860-1462~9, Fax: +82 2 860-1468, Internet: www.ktl.re.kr
3 m
Test Set-up: Radiated Fields
Model : e800
Ground Plane
Field sensor
EUT
Wooden table,
h= 0.8m