Working Cell // Generated for: spectre // Generated on: Oct 30 12 ...
Working Cell // Generated for: spectre // Generated on: Oct 30 12 ...
Working Cell // Generated for: spectre // Generated on: Oct 30 12 ...
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update too large: | -192.806 kV | > 88.7184 V + 1 uV<br />
V(MB:dbnode) = -88.7154 kV, previously -71.8481 mV.<br />
update too large: | -192.806 kV | > 88.7185 V + 1 uV<br />
V(MB:int_s) = -88.7154 kV, previously -7.29931 mV.<br />
update too large: | -192.805 kV | > 88.7186 V + 1 uV<br />
V(net3) = -10.6755 kV, previously -222.323 mV.<br />
update too large: | -20.3511 kV | > 10.6787 V + 1 uV<br />
V(M1:int_b) = -9.35099 kV, previously 214.647 mV.<br />
update too large: | -17.702 kV | > 9.354<strong>12</strong> V + 1 uV<br />
Top 10 Residue too large C<strong>on</strong>vergence failure:<br />
V(M1:dbnode) = -9.06619 kV, previously -68.4899 mV.<br />
residue too large: | -198.225 kA | > 5.72244 A + 1 pA<br />
V(MB:dbnode) = -88.7154 kV, previously -71.8481 mV.<br />
residue too large: | 159.434 kA | > 111.457 A + 1 pA<br />
V(M1:int_d) = -9.06624 kV, previously 2.56672 V.<br />
residue too large: | 1.45525 MA | > 1.05686 kA + 1 pA<br />
V(M1:gmnode) = -9.07933 kV, previously -562.627 mV.<br />
residue too large: | -2.36421 MA | > 2.<strong>12</strong>87 kA + 1 pA<br />
V(M1:int_s) = -9.06654 kV, previously -223.064 mV.<br />
residue too large: | 1.22248 MA | > 1.2062 kA + 1 pA<br />
V(M2:int_b) = -620.647 MV, previously -454.742 mV.<br />
residue too large: | 1.78641e+15 A | > 1.78641 TA + 1 pA<br />
V(M2:int_g) = 2.3318 MV, previously 2.56082 V.<br />
residue too large: | -1.78641e+15 A | > 1.78641 TA + 1 pA<br />
V(M1:int_g) = -9.06654 kV, previously -547.073 mV.<br />
residue too large: | -42.3906 kA | > 42.3925 A + 1 pA<br />
V(M1:int_b) = -9.35099 kV, previously 214.647 mV.<br />
residue too large: | 14.1466 kA | > 14.1496 A + 1 pA<br />
V(M2:sbnode) = 2.3318 MV, previously -72.7003 mV.<br />
residue too large: | -513.937 kA | > 536.972 A + 1 pA<br />
The following set of suggesti<strong>on</strong>s might help you avoid c<strong>on</strong>vergence difficulties.<br />
1. Evaluate and resolve any notice, warning, or error messages.<br />
2. Use realistic device models. Check all comp<strong>on</strong>ent parameters, particularly n<strong>on</strong>linear device model<br />
parameters, to ensure that they are reas<strong>on</strong>able.<br />
3. Small floating resistors c<strong>on</strong>nected to high impedance nodes might cause c<strong>on</strong>vergence difficulties.<br />
Avoid very small floating resistors, particularly small parasitic resistors in semic<strong>on</strong>ductors. Instead, use<br />
voltage sources or iprobes to measure current.<br />
4. Ensure that a complete set of parasitic capacitors is used <strong>on</strong> n<strong>on</strong>linear devices to avoid jumps in the<br />
soluti<strong>on</strong> wave<str<strong>on</strong>g>for</str<strong>on</strong>g>ms. On MOS models, specify n<strong>on</strong>zero source and drain areas.<br />
5. Per<str<strong>on</strong>g>for</str<strong>on</strong>g>m sanity check <strong>on</strong> the parameter values using the parameter range checker (use ``+param<br />
param-limits-file'' as a command line argument) and heed any warnings. Print the minimum and<br />
maximum parameter value using the `info' analysis. Ensure that the bounds given <str<strong>on</strong>g>for</str<strong>on</strong>g> instance, model,<br />
output, temperature-dependent, and operating-point (if possible) parameters are reas<strong>on</strong>able.<br />
6. Check the directi<strong>on</strong> of both independent and dependent current sources. C<strong>on</strong>vergence problems<br />
might result if current sources are c<strong>on</strong>nected such that they <str<strong>on</strong>g>for</str<strong>on</strong>g>ce current backward through diodes.