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Programm Photovoltaik Ausgabe 2009 ... - Bundesamt für Energie BFE

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5/5<br />

Mechanical testing:<br />

The mechanical reliability of the Si thin film is an important issue for the quality and the life time of the<br />

solar cells. During the processing, extended defect configurations and thermal mismatch between<br />

silicon and glass can destabilize the material. Mechanical crack formation in the silicon layer on the<br />

glass substrate can be studied by carrying out various standard tests as scratches, indentation, bending,<br />

and pulling (Fig. 4). The key materials parameters that needed to be measured are the fracture<br />

energy of the coating and the fracture energy for interfacial debonding.<br />

Three different tests have been applied to the Si thin film on glass substrate: Scratch tests, nanoindentations<br />

and pull tests. Scratch test is currently the adhesion test the more widely used by industry.<br />

It could be treated as two operations: normal indentation process and horizontal tip motion. A vertical<br />

increasing load is applied to the tip during scratching until the coating detaches from the substrate.<br />

The minimal critical load at which delamination occurs is used as a measure of the practical work of<br />

adhesion.<br />

Indentation testing is a simple method that consists essentially of touching the materiel of interest in<br />

order to determine the Young’s modulus and the hardness, quantities which will be used for the determination<br />

of fracture toughness and adhesion. Nanoindentation is an indentation test in which the<br />

length scale of penetration is measured in nanometers. In brittle material such as silicon, cracking of<br />

the specimen may occur during the indent especially when using a pyramidal tip as the three–sided<br />

Berkovich. The length of the crack, which often begins at the corner of the indentation impression, can<br />

be used to calculate the fracture toughness of the material. Microindents of higher length scale can<br />

also be processed down to the glass substrate in order to test the fracture resistivity of all materials.<br />

In Pull test the sample is glued between two pistons. The adhesive strength is determined by subjecting<br />

the specimen to some external load and measuring the critical values at which its fails.<br />

Figure 4: Sketch of the three types of tests applied to the Si thin film samples on glass substrates<br />

Other reports and results are confidential<br />

77/290<br />

Large grained, low stress multi-crystalline silicon thin film solar cells on glass by a novel combined diode laser and solid phase crystallization process, X. Maeder, Empa

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