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Programm Photovoltaik Ausgabe 2009 ... - Bundesamt für Energie BFE

Programm Photovoltaik Ausgabe 2009 ... - Bundesamt für Energie BFE

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Eidgenössisches Departement <strong>für</strong><br />

Umwelt, Verkehr, <strong>Energie</strong> und Kommunikation UVEK<br />

<strong>Bundesamt</strong> <strong>für</strong> <strong>Energie</strong> <strong>BFE</strong><br />

HIGH-EF - LARGE GRAINED, LOW STRESS<br />

MULTI-CRYSTALLINE SILICON THIN FILM<br />

SOLAR CELLS ON GLASS BY A NOVEL<br />

COMBINED DIODE LASER AND SOLID<br />

PHASE CRYSTALLIZATION PROCESS<br />

Annual Report 2008<br />

Author and Co-Authors X. Maeder, J. Michler<br />

Institution / Company Empa – Materials Science and Technology<br />

Address Feuerwerkerstr. 39, CH-3602 Thun, Switzerland<br />

Telephone, E-mail, Homepage +41 (0) 33 228 29 59, Xavier.Maeder@empa.ch, www.empa.ch<br />

Project- / Contract Number EU FP7 Grant Agreement Num. 213303<br />

Duration of the Project (from – to) 01.01.2008 - 31.12.2010<br />

Date 13.01.<strong>2009</strong><br />

ABSTRACT<br />

The objective of the High-ef project is to provide the silicon thin film photovoltaic (PV) industry with a<br />

process allowing high solar cell efficiencies (>10%) by large grains in the material at competitive production<br />

cost. The process is based on a combination of laser melt-mediated crystallization of an<br />

amorphous silicon (a-Si) seed layer ( 2�m) of the<br />

seed layer by solid phase epitaxy (SPE) process. The combined laser –SPE process represents a<br />

major break-through in silicon thin film photovoltaic on glass as it substantially enhances the grain<br />

size and reduces the defect density and the stress levels compared to e.g. standard solid phase crystallisation<br />

processes (SPC) on glass which provides grains less than 10�m in diameter with a high<br />

density of internal extended defects. A low cost laser processing will be developed in High-ef using<br />

highly efficient laser diodes with a wide line focus for the crystallisation of a large module area within<br />

one scan. The main tasks of Empa in the project are i) grains size, grain boundaries, texture and lattice<br />

defects characterizations of the Si thin film by electron backscatter diffraction techniques (EBSD),<br />

ii) elastic strains et residual stresses measurements by EBSD and iii) mechanical testing of the material.<br />

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