Programm Photovoltaik Ausgabe 2009 ... - Bundesamt für Energie BFE

Programm Photovoltaik Ausgabe 2009 ... - Bundesamt für Energie BFE Programm Photovoltaik Ausgabe 2009 ... - Bundesamt für Energie BFE

29.09.2012 Views

3/3 on the front side. All the layers are amorphous, except the p layer, which is microcrystalline. Then ITO was deposited on front and back side, and a thick Aluminum layer was sputtered on the back side. The small cell efficiency was about 15%, with a Voc of 690 mV. Using the same cell structure, screen printed cell exhibited much lower efficiency, due to higher series resistance, and optical losses due to the metallic grid. The high series resistance is mainly due to the intrinsic conductivity of non optimized silver paste. Contact resistance exhibits a very low value (1.10 -3 Ohm.cm 2 ), and is thus not taken into account. However, after a plating step, the fill factor greatly improves to the value obtained on small cells, increasing at the same time the cell efficiency. Using these two steps, one can say that there are now reduced electrical losses due to metallization, but optical losses (10%) coming from the optical shadowing by the grid remain relatively important. Collaborations IMT is active in collaboration on a national level with the EPFL for advanced transmission electron microscopy (TEM) sample preparation, supporting the textured heterojunction solar cell improvement. In addition, international “informal” collaborations have been conducted with the German Hahn- Meitner-Institut (HMI), the Japanese National Institute of Advanced Industrial Science and Technology (AIST) and the US-American National Renewable Energy Laboratory (NREL). IMT is since 2008 also taking part in the European project Hetsi, connecting the major European Institutes and Universities working on heterojunction devices. Evaluation 2008 and Outlook 2009 THIFIC was successfully launched in mid-2007. From the beginning of the project, we pursued the amorphous/crystalline silicon interface recombination modeling for fast heterojunction solar cell single process step analysis and improvement. Crucial parameters have now been identified to fabricate successfully devices on textured wafers. For this, at the end of 2008, an industrial compatible wetbench is being installed in completely new cleanroom facilities, dedicated for heterojunction devices studies. The same facilities will host a new multi-chamber PECVD system for further device development. In addition, larger area devices can now be fabricated as well (up to 5x5 cm 2 ). For this, different metallization schemes are under test. In early 2009, a state-of-the-art screen-printer will be installed as well as IMT. References [1] L. Fesquet, S. Olibet, E. Vallat-Sauvain, A. Shah, C. Ballif: High quality surface passivation and heterojunction fabrication by VHF-PECVD deposition of amorphous silicon on crystalline Si: Theory and experiments, to be published in the Proceedings of the 22th EU-PVSEC, Milano, Italy, 2007. [2] S. Olibet, C. Monachon, A. Hessler-Wyser, E. Vallat-Sauvain, L. Fesquet, J. Damon-Lacoste, S. De Wolf, and C. Ballif, Textured silicon heterojunction solar cells with over 700 mv open-circuit voltage studied by transmission electron microscopy , , to be published in the Proceedings of the 23th EU-PVSEC, Valencia, Spain, 2008. [3] S. De Wolf and M. Kondo, Abruptness of a-Si:H / c-Si interface revealed by carrier lifetime measurements, Appl. Phys. Lett. 90, 042111 (2007). [4] S. De Wolf, S. Olibet, and C. Ballif, Stretched-exponential a-Si:H / c-Si interface recombination decay, Appl. Phys. Lett. 93, 032101 (2008). THIFIC, De Wolf, IMT Neuchâtel 53/290

3/3<br />

on the front side. All the layers are amorphous, except the p layer, which is microcrystalline. Then ITO<br />

was deposited on front and back side, and a thick Aluminum layer was sputtered on the back side.<br />

The small cell efficiency was about 15%, with a Voc of 690 mV.<br />

Using the same cell structure, screen printed cell exhibited much lower efficiency, due to higher series<br />

resistance, and optical losses due to the metallic grid. The high series resistance is mainly due to the<br />

intrinsic conductivity of non optimized silver paste. Contact resistance exhibits a very low value<br />

(1.10 -3 Ohm.cm 2 ), and is thus not taken into account. However, after a plating step, the fill factor<br />

greatly improves to the value obtained on small cells, increasing at the same time the cell efficiency.<br />

Using these two steps, one can say that there are now reduced electrical losses due to metallization,<br />

but optical losses (10%) coming from the optical shadowing by the grid remain relatively important.<br />

Collaborations<br />

IMT is active in collaboration on a national level with the EPFL for advanced transmission electron<br />

microscopy (TEM) sample preparation, supporting the textured heterojunction solar cell improvement.<br />

In addition, international “informal” collaborations have been conducted with the German Hahn-<br />

Meitner-Institut (HMI), the Japanese National Institute of Advanced Industrial Science and Technology<br />

(AIST) and the US-American National Renewable Energy Laboratory (NREL). IMT is since 2008 also<br />

taking part in the European project Hetsi, connecting the major European Institutes and Universities<br />

working on heterojunction devices.<br />

Evaluation 2008 and Outlook <strong>2009</strong><br />

THIFIC was successfully launched in mid-2007. From the beginning of the project, we pursued the<br />

amorphous/crystalline silicon interface recombination modeling for fast heterojunction solar cell single<br />

process step analysis and improvement. Crucial parameters have now been identified to fabricate<br />

successfully devices on textured wafers. For this, at the end of 2008, an industrial compatible<br />

wetbench is being installed in completely new cleanroom facilities, dedicated for heterojunction devices<br />

studies. The same facilities will host a new multi-chamber PECVD system for further device development.<br />

In addition, larger area devices can now be fabricated as well (up to 5x5 cm 2 ). For this,<br />

different metallization schemes are under test. In early <strong>2009</strong>, a state-of-the-art screen-printer will be<br />

installed as well as IMT.<br />

References<br />

[1] L. Fesquet, S. Olibet, E. Vallat-Sauvain, A. Shah, C. Ballif: High quality surface passivation and heterojunction fabrication<br />

by VHF-PECVD deposition of amorphous silicon on crystalline Si: Theory and experiments, to be published<br />

in the Proceedings of the 22th EU-PVSEC, Milano, Italy, 2007.<br />

[2] S. Olibet, C. Monachon, A. Hessler-Wyser, E. Vallat-Sauvain, L. Fesquet, J. Damon-Lacoste, S. De Wolf, and C. Ballif,<br />

Textured silicon heterojunction solar cells with over 700 mv open-circuit voltage studied by transmission electron<br />

microscopy , , to be published in the Proceedings of the 23th EU-PVSEC, Valencia, Spain, 2008.<br />

[3] S. De Wolf and M. Kondo, Abruptness of a-Si:H / c-Si interface revealed by carrier lifetime measurements, Appl.<br />

Phys. Lett. 90, 042111 (2007).<br />

[4] S. De Wolf, S. Olibet, and C. Ballif, Stretched-exponential a-Si:H / c-Si interface recombination decay, Appl. Phys.<br />

Lett. 93, 032101 (2008).<br />

THIFIC, De Wolf, IMT Neuchâtel<br />

53/290

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