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Programm Photovoltaik Ausgabe 2008 ... - Bundesamt für Energie BFE

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5/7<br />

Testing of thickness, chemical composition of CIGS layers grown on in-line moving glass and<br />

polymer foil substrates<br />

For testing the chemical composition and thickness of the layer grown on in-line moving substrates the<br />

sample-holder was divided in several sections which were analyzed after the CIGS deposition step.<br />

The main interesting parameter is the compositional profile perpendicular to the substrate movement<br />

direction as homogeneity in the direction of the moving substrate can be expected to be homogeneous<br />

(which was confirmed as well). Figure 3 presents a processed sample with a typical compositional<br />

distribution across the direction perpendicular to the substrate movement. As it can be seen, variations<br />

are rather small if the measurement accuracy of +-3% is taken into account.<br />

elemental composition (at%)<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

-12 -4 4 12<br />

substrate position perpendicular to substrate movement (cm)<br />

Cu In<br />

Ga Se<br />

Figure 4: Elemental distribution over 25cm long distance perpendicular to the inline moving direction<br />

as measured by energy dispersive X-Ray Analysis. Homogeneity across the deposition<br />

width is reasonably good taken into account the measurements accuracy of the EDX system.<br />

Even though compositional homogeneity is of prior importance, layer thickness also needs to be controlled<br />

over the width of the substrate and should not show differences of more than +-10%. The thickness<br />

profile is investigated by removing fine lines of the CIGS layer and recording step sizes with a<br />

stylus profiler. Table 1 shows the recorded layer thickness across the substrate width.<br />

Distance from centreline (cm) -12.5 cm -4 4 12.5<br />

Layer thickness(nm) 1500 1520 1570 1560<br />

Table 1: Layer thickness measured over a distance of 25 cm perpendicular to substrate movement<br />

direction showing good thickness uniformity after improvement of the evaporation source<br />

profiles.<br />

By optimizing the deposition parameters encouraging homogeneity results were obtained with the<br />

used custom build deposition components. Table 2 shows the average values of measurements taken<br />

on a 30x30cm 2 sample and the according standard deviations.<br />

Large Area Flexible CIGS, D. Brémaud, ETHZ Seite 79 von 288

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