23.03.2013 Views

Damage formation and annealing studies of low energy ion implants ...

Damage formation and annealing studies of low energy ion implants ...

Damage formation and annealing studies of low energy ion implants ...

SHOW MORE
SHOW LESS

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

Figure 4.10 Illustrat<strong>ion</strong> <strong>of</strong> the Daresbury MEIS facility, from (3).<br />

The beamline is pumped to high vacuum <strong>and</strong> consists <strong>of</strong> a bending magnet,<br />

several electrostatic lenses, <strong>and</strong> beam steerers. Collimating slits at various locat<strong>ion</strong>s<br />

along the beamline are used to produce a beam with a divergence <strong>of</strong> 0.1° <strong>and</strong> a st<strong>and</strong>ard<br />

spot size <strong>of</strong> 1mm wide by 0.5 mm height on target. Most beam parameters can be<br />

controlled from a control room next to the experimental stat<strong>ion</strong>, al<strong>low</strong>ing the beam to be<br />

focused or defocused during the course <strong>of</strong> an experiment to optimise condit<strong>ion</strong>s for an<br />

experiment.<br />

The beam current is monitored using a thin wire grid placed in the beam. This<br />

al<strong>low</strong>s the beam current on target to be known. A current integrator monitors the beam<br />

current to ensure a reproducible beam dose on target.<br />

The experimental stat<strong>ion</strong> contains three ultra high vacuum (UHV) chambers <strong>and</strong><br />

a loadlock that is set up for rapid pumping to al<strong>low</strong> samples to be changed over quickly.<br />

Samples are mounted on holders that can be transferred from one chamber to the next<br />

on transfer arms. The scattering chamber houses a goniometer that can hold a sample<br />

holder <strong>and</strong> posit<strong>ion</strong> the sample into the beam. The goniometer has three translat<strong>ion</strong>al<br />

degrees <strong>of</strong> freedom, so that the posit<strong>ion</strong> <strong>of</strong> the beam on the sample can be moved <strong>and</strong><br />

three rotat<strong>ion</strong>al degrees <strong>of</strong> freedom that al<strong>low</strong> the sample to be aligned to the beam.<br />

These axes are named the rotat<strong>ion</strong>, spin <strong>and</strong> tilt axes, as designated in Figure 4.11. Each<br />

axis can be moved by a stepper motor controlled by the computer in the control room.<br />

79

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!