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Damage formation and annealing studies of low energy ion implants ...

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importance for many atomic collis<strong>ion</strong> problems, such as that <strong>of</strong> radiat<strong>ion</strong> damage in<br />

solids. The purpose was to find a way <strong>of</strong> calculating the potential for any <strong>ion</strong> – target<br />

combinat<strong>ion</strong>. Using a calculat<strong>ion</strong> <strong>of</strong> the interatomic potential for about 500 <strong>ion</strong> – target<br />

combinat<strong>ion</strong>s, a funct<strong>ion</strong> for the average potential could be produced.<br />

2.2.1 Scattering cross sect<strong>ion</strong><br />

The precise trajectories <strong>of</strong> the colliding particles depend on the impact parameter<br />

<strong>and</strong> the interact<strong>ion</strong> potential. This forms the basis <strong>of</strong> the quantitative calculat<strong>ion</strong> <strong>of</strong> the<br />

probability <strong>of</strong> scattering through a specific angle <strong>and</strong> the rate <strong>of</strong> elastic <strong>energy</strong> loss as<br />

the projectile particle passes through the solid target. The quantity <strong>of</strong> interest for both<br />

these calculat<strong>ion</strong>s is the so – called scattering cross – sect<strong>ion</strong> (14, 15, 16). It is used as a<br />

quantitative measure <strong>of</strong> the probability that an incident particle will be scattered by a<br />

target atom at an angle θ into a solid angle Ω <strong>and</strong> comes from the work <strong>of</strong> Rutherford in<br />

explaining the results <strong>of</strong> Geiger <strong>and</strong> Marsden on the scattering <strong>of</strong> alpha particles.<br />

If a uniform parallel flux <strong>of</strong> <strong>ion</strong>s is incident upon a stat<strong>ion</strong>ary atom, <strong>ion</strong>s at a<br />

certain p will be scattered into a cone <strong>of</strong> half angle θ as shown in Figure 2.1. The plane<br />

area defined by radii p <strong>and</strong> p + δp defines atoms that are scattered between angles θ <strong>and</strong><br />

θ + δθ. This area 2πpδp is known as the differential scattering cross sect<strong>ion</strong> (dσ) for<br />

scattering between impact parameter limits p <strong>and</strong> p + δp <strong>and</strong> scattering angles θ <strong>and</strong> θ +<br />

δθ. However the solid angle (dΩ) included by the cones <strong>of</strong> half angle θ <strong>and</strong> θ + δθ is<br />

equal to 2π sinθ δθ. The differential scattering cross sect<strong>ion</strong> for scattering into unit solid<br />

angle becomes:<br />

dσ<br />

pδp<br />

σ ( θ ) = =<br />

dΩ<br />

sinθδθ<br />

(2.5)<br />

The value <strong>of</strong> the differential scattering cross sect<strong>ion</strong> is given by:<br />

1 2<br />

σ = F⎢<br />

2 ⎥<br />

dΩ<br />

⎣4E<br />

sin ( θ / 2)<br />

⎦<br />

2<br />

2<br />

dσ<br />

⎡ Z Z e ⎤<br />

= g<br />

(2.6)<br />

( θ,<br />

M , M )<br />

where F is a funct<strong>ion</strong> derived from the Moliere potential, given by (9, 10):<br />

4<br />

3<br />

1<br />

0.<br />

042Z1Z<br />

2<br />

F = 1−<br />

(2.7)<br />

E<br />

<strong>and</strong> g is a multiplicat<strong>ion</strong> factor to account for the trans<strong>format<strong>ion</strong></strong> from the centre <strong>of</strong> mass<br />

to the lab frame <strong>of</strong> reference. The scattering yield will vary with the differential<br />

scattering cross sect<strong>ion</strong>. For condit<strong>ion</strong>s with a larger σ the scattering yield will therefore<br />

also be larger. This has important consequences for MEIS analysis <strong>and</strong> the rate <strong>of</strong><br />

18<br />

2

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