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Damage formation and annealing studies of low energy ion implants ...

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The enhancement mode transistor described is the type most commonly used. In<br />

comparison a deplet<strong>ion</strong> mode transistor is engineered to normally conduct by creating a<br />

thin doped layer <strong>of</strong> the same type as the source <strong>and</strong> drain underneath the gate. Applying<br />

a gate voltage which is opposite in polarity to the voltage applied in enhancement mode<br />

devices makes conduct<strong>ion</strong> stop. In all cases silicide or metal contacts al<strong>low</strong> the<br />

terminals to be connected to other devices by metal interconnects. The above is in fact a<br />

very simplified descript<strong>ion</strong> <strong>of</strong> a transistor. Many implantat<strong>ion</strong>s <strong>and</strong> processing steps are<br />

required to make a device.<br />

Figure 1.1 a) Schematic <strong>of</strong> a MOS transistor. b) XTEM image <strong>of</strong> an AMD<br />

optimised transistor with a gate length <strong>of</strong> 35 nm, modified from (16).<br />

In CMOS both NMOS <strong>and</strong> PMOS transistors are manufactured on a single<br />

wafer by first forming wells doped oppositely to the wafer in which to build the<br />

transistor in. Usually an n-type well is formed in a p-type wafer to form a PMOS<br />

device. The main advantage <strong>of</strong> CMOS over NMOS <strong>and</strong> bipolar technology is the much<br />

smaller power dissipat<strong>ion</strong>. Theoretically a CMOS circuit has almost no static power<br />

dissipat<strong>ion</strong> <strong>and</strong> power is only dissipated when the circuit switches (3).<br />

Two important physical parameters that affect transistor performance are the<br />

gate length Lg, <strong>and</strong> the SDE junct<strong>ion</strong> depth, Xj. The gate length has an important<br />

bearing on the speed <strong>of</strong> operat<strong>ion</strong> <strong>of</strong> a device, as the velocity <strong>of</strong> electron mot<strong>ion</strong> in Si is<br />

limited, therefore the time for the current to travel the distance from source to drain<br />

depends on the distance <strong>of</strong> travel. The junct<strong>ion</strong> depth has to be related to the gate length,<br />

as discussed be<strong>low</strong>. From an analysis point <strong>of</strong> view Xj is <strong>of</strong>ten somewhat arbitrarily<br />

taken to be the depth where the concentrat<strong>ion</strong> <strong>of</strong> dopants in the extens<strong>ion</strong> is 1E18 cm -3 .<br />

3<br />

Gate<br />

Extens<strong>ion</strong>s

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