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Design specific variation in pattern transfer by via/contact etch ...

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Etch Step <strong>in</strong> Pattern Transfer Simulation Flow<br />

� Etch step is important part of the <strong>pattern</strong> <strong>transfer</strong> technology <strong>in</strong> chip<br />

manufactur<strong>in</strong>g<br />

� While the exist<strong>in</strong>g capabilities of the predictions of post-illum<strong>in</strong>ation and<br />

post-photoresist development contours are <strong>in</strong> l<strong>in</strong>e with the current<br />

requirements, predictions of the post-<strong>etch</strong> contours are not so good.<br />

� Etch process is characterized <strong>by</strong> strong <strong>pattern</strong> density dependency<br />

Optical simulation<br />

Photoresist<br />

simulation<br />

Etch simulation<br />

Pattern Transfer <strong>in</strong> the Case<br />

of Contact Hole Etch<br />

Phot<br />

o<br />

BARC<br />

BARC/ME<br />

BARC/ME/OE<br />

Full Etch<br />

NCCAVS PAG, Sunnyvale,<br />

CA, 2005<br />

By D. Farber, B. Dostalik, B.<br />

Goodl<strong>in</strong>, et al (TI)<br />

It would be quite beneficial for both the design and process development<br />

communities to have a design automation tool capable of analyz<strong>in</strong>g the design<br />

quality regard<strong>in</strong>g the shape distortions (<strong>etch</strong> bias) caused <strong>by</strong> the employed<br />

<strong>etch</strong> recipe and, visa verse, the ability of the developed recipe to handle<br />

<strong>pattern</strong> density <strong>variation</strong> of a design to be manufactured.<br />

Copyright ©2008, Mentor Graphics.<br />

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