W. Richard Bowen and Nidal Hilal 4

C H A P T E R
2
Measurement of Particle
and Surface Interactions
Using Force Microscopy
Nidal Hilal, Daniel Johnson, W. Richard
Bowen and Paul M. Williams
O U T L I N E
2.1 Introduction 32
2.2 Colloid Probes 32
2.3 Interaction Forces 35
2.3.1 van der Waals Forces 35
2.3.2 Electrical Double Layer Forces 44
2.3.3 DLVO Theory 53
2.3.4 Solvation Forces 58
2.3.5 Steric Interaction Forces 62
2.3.6 Hydrophobic Interaction Forces 63
2.3.7 Effect of Hydrodynamic Drag on AFM Force Measurements 66
2.4 Adhesion Forces Measured by AFM 67
2.4.1 Contact Mechanics and Adhesion 67
2.5 Effect of Roughness on Measured Adhesion and Surface Forces 70
Abbreviations and Symbols 70
Greek Symbols 73
References 74
Atomic Force Microscopy in Process Engineering 31
© 2009, Elsevier Ltd