W. Richard Bowen and Nidal Hilal 4
W. Richard Bowen and Nidal Hilal 4
W. Richard Bowen and Nidal Hilal 4
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Natural organic matter, 140<br />
Negative pressure, 247<br />
Non-contact mode, 10–11<br />
Non-DLVO forces, 58<br />
O<br />
Optical microscope, 262, 264<br />
Outer Helmholtz plane (OHP), 46<br />
P<br />
Particle-bubble interactions, 81–106<br />
Pharmaceuticals, 173–90<br />
Phase angle, 250, 254–56<br />
Phase imaging, 10, 185–86<br />
Photolithography, 199<br />
Physisorption, 199<br />
Polymer demixing, 206<br />
Physisorption, 227, 230, 235<br />
Pinned micelles, 232<br />
Poisson-Boltzmann Equation, 45<br />
Polar liquids, 55<br />
Polymer brush, 228–36<br />
Polymer chains, 226–34, 237–41<br />
Polymer coatings, 225–26<br />
Pore size diameter, 115 distribution, 109,<br />
110, 116, 118, 119<br />
Pore size distribution, 140, 147–50, 168<br />
Powders, 174–75<br />
Primary alcohols, 61<br />
Q<br />
Q factor, see Quality factor<br />
Quality factor, 17<br />
R<br />
Resonance spectra, 256–59<br />
Resonant frequency, 17, 21, 258<br />
Retardation, 40<br />
Reverse osmosis, 108<br />
Reynolds number, 257<br />
Rheology, 246, 252–56, 262<br />
Roughness, 42, 44, 55, 69–70, 115, 120, 128,<br />
129, 134<br />
S<br />
Scanning probe lithography, 203<br />
Scanning thermal microscope, 186–90<br />
Self assembled monolayers (SAM), 199<br />
Self-assembly nanofabrication, 203<br />
SEM, 210<br />
InDEx 283<br />
Shear strain, 252, 255<br />
Shear stress, 252, 255<br />
Simple harmonic oscillator, 257<br />
Soft lithography, 201<br />
Solvation forces, 58–62<br />
Spring constant, 176–77<br />
Spring constant calibration, 16–22<br />
Spring constants, 87<br />
Star polymers, 237–240<br />
Steel, 132<br />
Steric interactions, 62<br />
Storage modulus, 253<br />
Stress fiber, 208<br />
Surface electrical properties, 117<br />
T<br />
Tack, 247, 249<br />
Tapping mode, 10, 236–37, 240, 250<br />
TEM, 210<br />
Tension, 246, 259–60<br />
Theta solvents, 62<br />
Thin liquid films, 254, 260<br />
Three-phase contact, 83, 88–90, 94–95, 97<br />
Threshold force, 94–95, 97<br />
Torsional spring constant, 21–22<br />
U<br />
Ultrafiltration, 108<br />
Uniaxial extension, 267<br />
V<br />
van der Waals forces, 35–44, 83–84,<br />
91, 227<br />
Debye forces, 35–37<br />
Keesom forces, 35–37<br />
London dispersion forces, 35–37<br />
Measurement by AFM, 42<br />
Viscoelasticity, 249, 252–53, 255, 259<br />
Viscosity, 247, 255–59<br />
W<br />
Work of adhesion, 43, 84<br />
Y<br />
Young equation, 88–89<br />
Young’s modulus (E), 180–82, 215, 247<br />
see also Elastic modulus<br />
Z<br />
Zeroth-order Stern model, 51
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