W. Richard Bowen and Nidal Hilal 4

270 9. APPLICATION OF ATOMIC FORCE MICROSCOPy
ε Shear strain
� Shear viscosity Pa s
� Exponential damping length m
� Mass per unit length of cantilever kg m �1
� c Cantilever density kg m �3
� fluid Fluid density kg m �3
� Shear stress N m �2
φ Phase difference between substrate and cantilever °
� Frequency
� R
� vacuum
Resonant frequency
Resonant frequency in vacuum
� Correction factor
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