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W. Richard Bowen and Nidal Hilal 4

W. Richard Bowen and Nidal Hilal 4

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164 5. AFM AND DEvELOPMENT OF (BIO)FOULINg-REsIsTANT MEMBRANEs<br />

300<br />

(a)<br />

Å<br />

2.00<br />

1.00<br />

0.00<br />

200<br />

Å<br />

100<br />

0 0<br />

100<br />

Å<br />

200<br />

300<br />

Å<br />

4.00<br />

3.00<br />

2.00<br />

1.00<br />

0.00<br />

200<br />

Å<br />

100 100<br />

due to increase in the surface porosity. Changes in the thickness <strong>and</strong>/or<br />

the structure of the porous layer of the membrane may account for this.<br />

Force measurements were also carried out between �4-�m silica<br />

spheres <strong>and</strong> membranes. Figure 5.22 shows examples of typical data for<br />

force measurements taken from polysulphone membranes, with <strong>and</strong> without<br />

SPEEK present in 0.01 M NaCl. For the non-SPEEK membrane (P-P) the<br />

colloid probe snaps-in to the membrane surface, which indicates the presence<br />

of long-range attractive forces, sufficient in magnitude to overcome<br />

the restoring force on the cantilever. This type of attraction leads to fouling<br />

300<br />

0 0<br />

fIgurE 5.21 AFM images of polysulphone membranes obtained with contact mode in<br />

air. (a) Polysulphone membrane <strong>and</strong> (b) polysulphone/SPEEK membrane (5% SPEEK prepared<br />

at 20°C). Roughness values were obtained from 2 � 2 �m images.<br />

tAblE 5.6 summary of AFM Characterisation Data for sPEEK Modified<br />

Polysulfone Membranes.<br />

(b)<br />

P-P S0.5-20 S2-20 S5-20 S2-10 S2-60<br />

r p (nm) 0.93 � 0.15 0.89 � 0.22 0.93 � 0.15 0.73 � 0.18 1.05 � 0.22 0.86 � 0.26<br />

rms roughness<br />

(nm)<br />

3.2 4.2 3.5 2.5 3.1 2.1<br />

Porosity, e (%) 6.0 9.0 14.1 16.9 15.1 12.8<br />

Snap-in events<br />

(out of 9)<br />

F off, F/R<br />

(mN/m)<br />

9 4 3 0 1 4<br />

28.5 � 4.3 10.0 � 14.8 3.9 � 1.6 0.75 � 2.7 � 2.8 9.6 � 5.3<br />

Å<br />

200<br />

300

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