Elektromigration in Gold und Silber Nanostrukturen

128 Literatur
[190] M. Hartmann, Untersuchungen zur Elektromigration von Nanostrukturierten
Silber-Leiterbahnen, Diplomarbeit, Duisburg (2006).
[191] F.-J. Meyer zu Heringdorf, private Mitteilung.
[192] B. Stahlmecke, L. Í. Chelaru, F.-J. Meyer zu Heringdorf, G. Dumpich, AIP Confe-
rence Proceedings 817, 65 (2006), Electromigration in gold and single crystalline
silver nanowires.
[193] R. S. Sorbello, Theory of electromigration in Solid State Physics, Bd. 51, H. Eh-
renreich, F. Spaepen (Eds.), Academic Press, London, New York (1991).
[194] R. E. Hummel, H. J. Geier, Thin Solid Films 25, 335 (1975), Activation energy
for electrotransport in thin silver and gold films.
[195] R. E. Hummel, R. M. Breitling, Appl. Phys. Lett. 18(9), 373 (1971), On the
direction of electromigration in thin silver, gold and copper films.
[196] R. E. Hummel, R. T. DeHoff, Appl. Phys. Lett. 27(2), 64 (1975), On the contro-
versy about the direction of electrotransport in thin gold films.
[197] R. E. Hummel, B. K. Krumeich, R. T. DeHoff, Appl. Phys. Lett. 33(11), 960
(1978), The effect of minor constituents on the electrotransport-induced failure
site in thin gold films.
[198] R. E. Hummel, S. Matts-Goho, R. T. DeHoff, J. Appl. Phys. 54(4), 2855 (1983),
New insights on the reversal of the site of electromigration failure in gold films
doped with alkali.