Adsorbat-modifiziertes Wachstum ultradünner Seltenerdoxid ... - E-LIB

Literaturverzeichnis
[1] Kaemena, B.; Senanayake, S. D.; Meyer, A.; Sadowski, J. T.; Falta,
J.; Flege, J. I.: Growth and morphology of ceria on ruthenium (0001). In:
J. Phys. Chem. C 117 (2013), S. 221–232. DOI: 10.1021/jp3081782
[2] Wilk, G. D.; Wallace, R. M.; Anthony, J. M.: High-κ gate dielectrics:
current status and materials properties considerations. In: J. Appl. Phys. 89
(2001), S. 5243–5275. DOI: 10.1063/1.1361065
[3] Hillebrecht, F. U.; Ronay, Maria; Rieger, D.; Himpsel, F. J.: Enhancement
of Si oxidation by cerium overlayers and formation of cerium silicate.
In: Phys. Rev. B 34 (1986), S. 5377–5380. DOI: 10.1103/PhysRevB.34.5377
[4] Steele, B. C. H.; Heinzel, A.: Materials for fuel-cell technologies. In: Nature
414 (2001), S. 345–352. DOI: 10.1038/35104620
[5] Jacobson, A. J.: Materials for solid oxide fuel cells. In: Chem. Mater. 22
(2010), S. 660–674. DOI: 10.1021/cm902640j
[6] Bene, R.; Perczel, I. V.; Réti, F.; Meyer, F. A.; Fleisher, M.; Meixner,
H.: Chemical reactions in the detection of acetone and NO by a
CeO 2 thin film. In: Sensor. Actuat. B-Chem. 71 (2000), S. 36–41. DOI:
10.1016/S0925-4005(00)00592-X
[7] Jasinski, P.; Suzuki, T.; Anderson, H. U.: Nanocrystalline undoped ceria
oxygen sensor. In: Sensor. Actuat. B-Chem. 95 (2003), S. 73. DOI:
10.1016/S0925-4005(03)00407-6
[8] Sun, E. Y.; Goyal, A.; Norton, D. P.; Park, C.; Kroeger, D. M.; Paranthaman,
M.; Christen, D. K.: High-resolution transmission electron
microscopy/analytical electron microscopy characterization of epitaxial oxide
multilayers fabricated by laser ablation on biaxially textured Ni. In: Physica
C 321 (1999), S. 29–38. DOI: 10.1016/S0921-4534(99)00342-1
[9] MacManus-Driscoll, J. L.; Foltyn, S. R.; Jia, Q. X.; Wang, H.; Serquis,
A.; Maiorov, B.; Civale, L.; Lin, Y.; Hawley, M. E.; Maley, M. P.;
Peterson, D. E.: Systematic enhancement of in-field critical current density
with rare-earth ion size variance in superconducting rare-earth barium cuprate
films. In: Appl. Phys. Lett. 84 (2004), S. 5329–5331. DOI: 10.1063/1.1766394
181